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A Method for Analyzing the Propagation Process of Single Event Soft Error in System Using Fault Coupling Matrix

A technology of coupling matrix and propagation process, which is applied in the field of single event soft error propagation process of the analysis system using fault coupling matrix, can solve problems such as system function failure, achieve reasonable and effective analysis results, and simple and easy implementation process

Active Publication Date: 2017-03-22
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

A single event soft error occurs in a transistor or memory unit of the system, but it may eventually lead to the failure of the system function. This process involves the propagation and diffusion of single event soft errors in the system

Method used

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  • A Method for Analyzing the Propagation Process of Single Event Soft Error in System Using Fault Coupling Matrix
  • A Method for Analyzing the Propagation Process of Single Event Soft Error in System Using Fault Coupling Matrix
  • A Method for Analyzing the Propagation Process of Single Event Soft Error in System Using Fault Coupling Matrix

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Embodiment Construction

[0015] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0016] A method of the present invention for analyzing the propagation process of single event soft errors in a system by using a fault coupling matrix. The error propagation coupling factor; then, establish the single event soft error coupling matrix of the system, and modify the matrix elements corresponding to the coupling factors between two functional modules; next, establish the fault state vector of the system function module, and simulate the single event soft error of the functional module The change of the system fault state vector after the error occurs, the number of functional modules that have failed in the system is counted, and the propagation and influence process of the single event soft error in the system is analyzed. The method of the invention can realize intuitive and quantitative analysis of the fault propagati...

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Abstract

The invention discloses a method for analyzing a system single-particle soft error propagation process through a fault coupling matrix. The method is characterized in that a system is divided into function modules, mutual influence factors of a signal relationship and a logic relationship among the function modules are analyzed, and single-particle soft error propagation coupling factors are determined; a single-particle soft error coupling matrix of the system is built, and a matrix element corresponding to the single-particle soft error propagation coupling factor between every two function modules is modified; a fault state vector of each function module of the system is built, the changes of the fault state vectors of the system are simulated after the function modules have single-particle soft errors, the number of the system function modules having faults is counted, and the propagation and influencing process of the single-particle soft errors in the system is analyzed. The method for analyzing the system single-particle soft error propagation process through the fault coupling matrix has the advantages of being simple in principle, easy to operate, reasonable and effective in analysis result and the like.

Description

technical field [0001] The invention mainly relates to the technical field of electronic system reliability analysis, in particular to a method for analyzing the propagation process of a single particle soft error in a system by using a fault coupling matrix. Background technique [0002] The success of large-scale integrated circuits in space electronic instruments has made it widely used, and it has shown its excellent task management and signal processing capabilities; however, due to space radiation effects, such as single event soft errors, its operational stability is seriously threatened , and this threat is becoming more and more serious with the reduction of CMOS circuit manufacturing process, but it is obviously not enough to strengthen only from the aspects of processing technology and device structure, and it is necessary to design from the system level to improve the operation stability of the entire electronic system . [0003] The main goal of hardening at th...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36
Inventor 杨俊王跃科邢克飞何伟胡梅杨道宁刘思恺
Owner NAT UNIV OF DEFENSE TECH
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