Capacitive touch sensor tester

Abstract

The invention relates to a capacitive touch sensor tester which comprises a DSP, a source program memorizer, a correcting interface, a static random memorizer, a first CPLD and a second CPLD. Signal output and feedback are achieved, the first CPLD is connected with a scanning card control interface, a power-down automatic memorizer and a communication circuit to achieve signal output and feedback, and the second CPLD is respectively connected with a DDS, a programmable amplifying circuit, a programmable I / V conversion circuit, an output selection switch and a digital-to-analog conversion D / A to achieve signal transmission. The DSP sends out measuring signals, signals obtained by measuring a tested object by a scanning card are transmitted to a programmable amplifier to be converted into voltage signals suitable for being measured, a main LFP low-pass circuit converts analog signals into digital signals through an ADC, impedance, inductance values, capacitance and the like with the high activity accuracy are processed through the DSP, testing is efficient and fast, and observation, metering and later analysis are facilitated.

Description

technical field [0001] The invention relates to a test device in the electronic technology industry, in particular to a capacitive touch sensor tester. Background technique [0002] In the field of electronic technology, with the widespread use of electronic products and components, the technology and performance of domestic electronic products are also constantly developing and improving, and the requirements for the detection technology of components in related domestic industries are also constantly improving, especially In order to ensure the performance of its own technical parameters when the components are used, it is necessary to obtain reliable data. At present, most of the components are tested with ARM processors, which can only detect a single component, and the measurement speed is slow, and the obtained values ​​​​are deviation. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a capacitive touch sen...

AI Technical Summary

Problems solved by technology

[0002] In the field of electronic technology, with the widespread use of electronic products and components, the technology and performance of domestic electronic products are also constantly developing and improving, and the requirements for the detection technology of components in related domestic industries are also constantly improving, especially In order to ensure the performance of its own technical parameters when the components are used, it is necessary to obtain reliable data. At present, most of the components are tested with ARM processors, which can only detect a single component, and the measurement speed is slow, and the obtained values ​​​​are deviation

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