Surface microstructure based high-accuracy length detection method

Abstract

The invention provides a surface microstructure based high-accuracy length detection method and belongs to the high-accuracy length detection field. The surface microstructure based high-accuracy length detection method comprises adjusting a measurement device to be located in a horizontal state and opening a lighting source and an image acquisition system; placing an anti-shaking driving fixture for an object to be detected on the lateral side to be fixed and leveled; enabling a resolution test card to be closely attached to the surface of the object to be detected, adjusting the magnification of a first magnifier group and a second magnifier group to obtain appropriate resolution stripes of images and calculating and displaying the resolution through measurement software due to the fact that the appropriate view fields in respective camera system view fields can be simultaneously occupied by the surface microstructure of the object to be detected due to the transparent resolution test card; starting an image storage system, horizontally moving the object to be detected and displaying and storing data output from camera systems through the system; calculating and storing the displacement of the surface microstructure of the object to be detected between adjacent images through a calculation module according to parameters such as the resolution calibrated through the test card; achieving detection, stopping the image storage system and enabling a direct current motor and an image storage module to stop working.

Description

technical field [0001] The invention relates to a length detection method which utilizes the continuous change of the surface microstructure of the object to be detected during the displacement process, and belongs to the field of high-precision length detection. Background technique [0002] There are many methods for micro-displacement measurement: mechanical measurement method (vernier caliper, micrometer, etc.), optical lever method, optical interference method and sensor conversion method. These methods are widely used, but also have their inherent drawbacks. The mechanical measurement method uses the comparison between the object to be measured and the etalon to obtain the measurement result. It is necessary to give the measurement tool (vernier caliper, micrometer, etc.) a start and end point that can be clamped. The range is mostly within 30 cm, and the resolution can reach 10 microns; The lever method uses optical amplification to achieve distance measurement. It r...

AI Technical Summary

Problems solved by technology

[0004] The present invention provides a high-precision length detection method based on surface microstructure in order to solve the problem that accurate measurement results cannot be obtained by using the existing technology to detect surfaces with no fixed start and stop clamping points, large range and high detection accuracy requirements

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