Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Optimization method of SIFT characteristic matching points based on limit restraint

A feature matching and limit constraint technology, applied in the field of image matching, can solve the problems of matching process error, low matching rate, incorrect and so on

Inactive Publication Date: 2014-09-03
SUZHOU UNIV OF SCI & TECH
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, no matter which algorithm is used, there is a possibility of errors in the matching process. Therefore, eliminating wrong point pairs during the matching process plays an important role in improving the matching rate.
[0003] After matching the local features extracted by Scale-invariant feature transform (SIFT) in the case of camera translation, the feature points are detected in SIFT, and the feature descriptor is calculated. The Euclidean distance for the feature descriptor In this matching process, in order to ensure the efficiency of matching, the algorithm of K nearest nodes is used for Euclidean distance matching. In order to ensure the correct cross-matching of matching, the matching point pair obtained so far is the correct point in the SIFT algorithm. Yes, due to the limitations of the SIFT feature and the systematic error of the algorithm, some of the matching point pairs obtained are incorrect, resulting in a low matching rate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Optimization method of SIFT characteristic matching points based on limit restraint

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] like figure 1 As shown, the SIFT feature matching point optimization method based on limit constraints of the present invention specifically includes the following steps:

[0023] 1. Detect all SIFT feature points in each image, and extract the 128-dimensional descriptor vector of each feature point.

[0024] 2. Match the feature points in Image0 and Image1: use the Euclidean distance between vectors to find the two feature points nearest and next to each feature point in Image0 in the feature points of Image1, and calculate the nearest and next distances Dis0 and Dis1, and record Dis0 / Dis1 as ratio; at this time, each feature point in Image0 has a ratio value (ratio>0).

[0025] 3. Among all the feature points of Image0, find out all the points with ratio<0.382 and store them in the point set V1.

[0026] 4. Calculate the pixel distance between each feature point and the nearest feature point in Image1 in V1, and store the feature points with 0

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an optimization method of SIFT characteristic matching points based on limit restraint, and aims at overcoming disadvantages of SIFT characteristic matching points. Obtained matching points at present are divided into a high-quality point set V11, a standard point set V12 and a to-be-measured point set V13, the standard point set V12 and to-be-measured point set V13 are updated, the high-quality point set V11, the updated standard point set V12 and the updated to-be-measured point set V13 are combined, a basic camera matrix F is calculated again in an RANSAC method, and exterior points are rejected. Thus, the matching rate is effectively improved, the computational complexity in the budgeting process is low, and computation is rapid.

Description

technical field [0001] The invention belongs to the category of image matching technology in the field of image processing and pattern recognition, and in particular relates to a method for optimizing SIFT feature matching points based on limit constraints. Background technique [0002] Image matching technology is mainly a method to find the same image target through the corresponding relationship, similarity and consistency analysis of image content, features, structure, relationship, texture and gray level. Image matching technology can be divided into: matching technology based on image grayscale, matching technology based on image features, matching technology based on template matching and matching technology based on transform domain. The basic idea of ​​grayscale matching: regard the image as a two-dimensional signal from a statistical point of view, use the statistical correlation method to find the correlation match between the signals, and use the correlation func...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00G06K9/46
Inventor 胡伏原董治方吴宏杰
Owner SUZHOU UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products