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Leaf area index measuring method and system

A technology of leaf area index and measurement method, which is applied to measuring devices, instruments, and optical devices, etc., can solve the problems of lowering the accuracy of leaf area index, and achieve the effect of improving the accuracy and improving the accuracy.

Inactive Publication Date: 2014-08-13
INST OF REMOTE SENSING & DIGITAL EARTH CHINESE ACADEMY OF SCI
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Problems solved by technology

[0006] In view of this, embodiments of the present invention provide a method and system for measuring leaf area index, which are used to solve the problem of reduced accuracy of leaf area index obtained by existing leaf area index measuring methods. The technical solution is as follows:

Method used

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  • Leaf area index measuring method and system
  • Leaf area index measuring method and system

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Embodiment Construction

[0047]In order to enable those skilled in the art to better understand the embodiments of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] see figure 1 , which shows a flow chart of the method for measuring the leaf area index provided by the embodiment of the present invention, which may include the following steps:

[0049] 101: Obtain images of leaves collected in the quadrat.

[0050] The image of the collected leaves is the image formed by non-overlap...

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Abstract

The invention provides a leaf area index measuring method and system. The leaf area index measuring method comprises the steps of obtaining images of collected leaves in a quadrat, obtaining the areas of all the leaves collected in the quadrat according to the images of the collected leaves, obtaining the images of the residual leaves in the quadrat, obtaining the areas of the residual leaves in the quadrat according to the images of the residual leaves, adding the areas of all the collected leaves to the areas of the residual leaves to obtain the leaf total area A in the quadrat. Thus, the leaf total area obtained by adding the areas of all the collected leaves to the areas of the residual leaves is basically equal to the areas of all the leaves in the quadrat, then a leaf area index LAI of the quadrat is obtained according to a formula LAI=A / S, the accuracy is improved correspondingly, and S is the area of the quadrat.

Description

technical field [0001] The invention relates to the technical field of ecosystems, in particular to a method and system for measuring leaf area index. Background technique [0002] Leaf Area Index (LAI) is also called leaf area index, which refers to the multiple of the total area of ​​plant leaves on the land area per unit land area, that is, leaf area index = total leaf area / land area refers to the number of plant leaves on a piece of land. The ratio of total area to land area. In the ecosystem, the leaf area index is an important structural parameter of the ecosystem, which is used to reflect the number of plant leaves, the change of the canopy structure, the vitality of the plant community and its environmental effects, and it is a description of the material and energy exchange on the surface of the plant canopy. It provides structured quantitative information and is a very important parameter in the study of ecosystem carbon accumulation, vegetation productivity and t...

Claims

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Application Information

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IPC IPC(8): G01B11/28
Inventor 张兵焦全军刘良云胡勇刘新杰唐凤莉
Owner INST OF REMOTE SENSING & DIGITAL EARTH CHINESE ACADEMY OF SCI
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