Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for measuring dual-jet direct-current arc plasma space temperature field in real time

A plasma and DC arc technology, applied in electrical radiation detectors and other directions, can solve the problems of narrow measurement temperature range, low temperature measurement accuracy, low spatial resolution, etc., and achieves a simple and feasible method, improved calibration accuracy, and good dynamic performance. Effect

Active Publication Date: 2014-08-06
TSINGHUA UNIV
View PDF3 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The experimental equipment required by the probe method is simple and easy to operate, but it has the following disadvantages: the spatial resolution is low; the measurement temperature range is narrow; the temperature of unsteady objects cannot be measured well; Plasma, the reaction speed cannot meet the real-time requirements; the contact with the measured object will also affect the temperature field distribution of the thermal plasma to a certain extent
[0005] In the actual radiation imaging system, the lens group, optical glass, filter and other optical devices are often loaded in front of the CCD sensor, and it is difficult to achieve a strictly proportional relationship between the intensity of the spectral line and the gray level of the image.
It is relatively simple to calibrate the gray value and temperature by using the absolute intensity method of spectral lines, but the temperature measurement accuracy is low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for measuring dual-jet direct-current arc plasma space temperature field in real time
  • Method for measuring dual-jet direct-current arc plasma space temperature field in real time
  • Method for measuring dual-jet direct-current arc plasma space temperature field in real time

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The technical solution provided by the invention is: the method is based on the emission spectrum temperature measurement theory, and the temperature field is measured on the image information collected by the CCD camera loaded with a narrow-band filter. The method is based on the double-jet plasma experimental platform, and the research object is argon discharge thermal plasma under atmospheric pressure. Based on the violent pulsation characteristics of thermal plasma discharge, the two CCD cameras loaded with filters are externally triggered to collect discharge images synchronously, and achieve stereo matching for the synchronously collected left and right images. The calibration experiment of the CCD system is designed, and the calibration between the gray value of the single-wavelength image and the intensity of the spectral line is completed. Based on the calibration relationship, the gray values ​​of the left and right images collected synchronously are converted...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for measuring a dual-jet direct-current arc plasma space temperature field in real time, and belongs to the technical field of hot plasma temperature measurement. The method is characterized in that in a real-time measurement system, internal and external parameters of given cameras are worked out, calibration and stereo correction are conducted, two matched target images preprocessed through a set parallax deviation are obtained, the intensities of spectral lines on corresponding pixel points at the same moment are obtained from a spectrograph, a gray value-spectral line intensity mapping table is built, and the electron excitation temperature of a spatial point corresponding to the similar spectral lines is calculated through the relative intensities of the spectral lines, wherein the real-time measurement system is composed of a plasma generator, an image information acquisition device, a spectrum acquisition device and a computer, the image information acquisition device is formed by splicing the two CCD cameras, optical filters with different central wavelengths are arranged in front of lenses on the two sides, the spectrum acquisition device is mainly composed of the spectrograph, and the computer is connected with a triggering signal output card used for synchronously triggering the two CCD cameras and the spectrograph. The method is simple and feasible, the resolution ratio and temperature measurement accuracy are high, and dynamic performance is good.

Description

technical field [0001] The invention relates to a real-time measurement method for double-jet DC arc plasma temperature, which belongs to the field of thermal plasma temperature measurement. Background technique [0002] Based on the high temperature characteristics of thermal plasma, commonly used temperature diagnosis methods can be divided into probe method and emission spectroscopy method. The experimental equipment required by the probe method is simple and easy to operate, but it has the following disadvantages: the spatial resolution is low; the measurement temperature range is narrow; the temperature of unsteady objects cannot be measured well; Plasma, the reaction speed cannot meet the real-time requirements; the contact with the measured object will also affect the temperature field distribution of the thermal plasma to a certain extent. [0003] When using emission spectroscopy to measure temperature, it is usually assumed that the plasma satisfies the local ther...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J5/20
Inventor 李和平李鹏郭恒葛楠包成玉
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products