FFT (fast Fourier transform) reinforcing design method with single event upset-resistant capability

A design method and anti-single event technology, applied in the direction of complex mathematical operations, etc., can solve the problems of unseen reinforcement methods, low space resource utilization, resource waste, etc., to improve anti-single event flipping ability, save space resources and costs , to ensure the effect of reliability and accuracy

Active Publication Date: 2014-07-30
XIAN INSTITUE OF SPACE RADIO TECH
View PDF2 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current reinforcement method mainly adopts three-mode redundancy and refreshing for the entire algorithm process to reduce the impact of the single event flip effect of the circuit, but the technical means of adopting three-mode redundancy and refreshing for the entire algorithm process requires high system resource allocation , the waste of resources is very serious, which makes the entire implementation system too complicated, which is not conducive to the application of the system in space. At the same time, the current methods mostly focus on the three-mode redundancy and only output after judgment, but the wrong one output is not updated in time. Correction, resulting in a low utilization rate of space resources, and now there is an urgent need for a technology that can quickly implement the FFT algorithm in space and at the same time complete the FFT reinforcement technology. The currently retrieved literature does not see any specific sensitive components in the FFT circuit structure. reinforcement method,

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • FFT (fast Fourier transform) reinforcing design method with single event upset-resistant capability
  • FFT (fast Fourier transform) reinforcing design method with single event upset-resistant capability
  • FFT (fast Fourier transform) reinforcing design method with single event upset-resistant capability

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] Further illustrate working principle and working process of the present invention below in conjunction with accompanying drawing:

[0019] Such as figure 1 As shown, the present invention provides an anti-single event reversal FFT reinforcement design method, and the implementation method is as follows:

[0020] (1) Analyze the structure of the FFT algorithm, find out the ROM that stores the twiddle factors when the FFT circuit is realized, the RAM that stores the final data and realizes the inversion order, and the key registers that look for the twiddle factors; after the key registers are affected by the single event effect, Registers where errors can occur and affect subsequent calculations.

[0021] Through the specific analysis of the implementation structure of the radix-2FFT, radix-4FFT and split-radix FFT algorithms, the present invention finds that although different FFT algorithms are slightly different at the algorithm level, the basic operation structure i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an FFT (fast Fourier transform) reinforcing design method with single event upset-resistant capability. The method comprises the following steps of analyzing an FFT algorithm and a circuit structure, adopting an RAM (random access memory) structure for the required ROM (read only memory) which is used for storing twiddle factors in a circuit, and carrying out feedback type triple modular redundancy reinforcing on the data and addresses of the RAM; reinforcing the RAM which is used for storing the final results and has bit-reversed order in the circuit, respectively reinforcing the data and addresses of RAM, and respectively carrying out feedback type triple modular redundancy and triple modular redundancy on an address register and data; carrying out the feedback type triple modular redundancy on a key register which is used for finding the twiddle factors in the ROM. The method has the advantages that the reliability of the FFT circuit in the space environment is improved, the single event upset-resistant capability of the FFT circuit is improved, the certain flexibility in the reinforcing design is realized, the design of FFT circuit with higher single event upset-resistant capability is provided for equipment, and the method can be quickly applied to the research and development of satellite processing equipment.

Description

technical field [0001] The invention relates to an FFT reinforcement design method for anti-single event flipping, and belongs to the technical field of anti-single event effect reinforcement. Background technique [0002] Fast Fourier Transform (FFT, Fast Fourier Transform) is a very important transformation in the analysis and processing of digital signals in communication systems. It is widely used in the field of space communication. The current FFT algorithm structure basically includes radix-2FFT, radix-4FFT, split-radix FFT, mixed-radix FFT and a class of algorithms represented by Winograd algorithm (prime factor algorithm, Winograd algorithm). Among them, radix-2FFT, radix-4FFT, split-radix FFT and mixed-radix FFT are algorithms for integer powers of N equal to 2; prime factor algorithms and Winograd algorithms are algorithms for integer powers of N not equal to 2. The two types of algorithms have their own advantages and disadvantages for specific application situ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F17/14
Inventor 杨玉辰周国昌赖晓玲李维佳张国霞高翔
Owner XIAN INSTITUE OF SPACE RADIO TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products