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A simulation device and simulation method for poor contact conduction between conductors

A technology of simulating device and simulating method, applied in electronic circuit testing and other directions, can solve problems such as poor contact conduction of terminals, performance testing, etc., and achieve the effects of simple and lightweight device, good reliability, and wide application range

Active Publication Date: 2016-08-17
JIANGSU LVSUNNY VISION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the traditional electric network connection, electronic circuit connection or other circuit structures cannot test the poor contact conduction performance of the circuit-connected terminals, the present invention provides a simulation device and simulation method for poor contact conduction between conductors

Method used

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  • A simulation device and simulation method for poor contact conduction between conductors
  • A simulation device and simulation method for poor contact conduction between conductors
  • A simulation device and simulation method for poor contact conduction between conductors

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Embodiment Construction

[0027] In this embodiment, the LED driving power supply is used as the test object to simulate the influence of poor conduction of the circuit connection terminals on the circuit system. This simulation method can also simulate the influence of poor contact of the connection terminals of circuit structures such as hardware switches, switching power supplies, electronic circuit connections, and power grid connections on the system control.

[0028] figure 1 In the present invention, there is an embodiment of a sheet-shaped contact electrode. Pig iron with lower conductivity is selected as the block contact electrode 2, and a steel sheet material with lower conductivity and better elasticity is used as the sheet contact electrode 1. The conductivity of the two electrodes should be smaller than the resistivity of the actual contact terminal in the tested circuit to ensure the reliability of the test results. Several springs are used as elastic tensioning devices. One end of the ...

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Abstract

The invention discloses a simulation device and method of poor contact conduction among conductors. In the simulation device, slice-shaped contact electrodes and block-shaped contact electrodes make contact with an adjustable structure, so that the contact area and contact pressure between the electrodes are adjusted, then rusting and oxidizing of the electrodes are simulated in an electrode heating or humidifying mode, and the whole simulation portion is connected to a tested circuit structure through a soft conductive wire. By observing stability of voltages and currents of the tested circuit, influence on performance of the whole circuit product caused by poor contact of a circuit terminal can be simulated in short order, the development cycle of the product is shortened, and reliability of the product is enhanced.

Description

technical field [0001] The invention relates to a simulation device and a simulation method for testing circuit performance, in particular to a simulation device and a simulation method for poor contact conduction between conductors. Background technique [0002] The main reasons for the poor contact conductivity of the terminal are as follows: a. The surface of the conductor is oxidized; b. The surface is rusted; c. The elasticity of the terminal shrapnel is too small; d. The conductivity of the conductor shrapnel is too small. These phenomena have all caused the contact resistance between the conductive shrapnel and the wire to increase. After the current passes, phenomena such as ignition and arcing will occur, which will reduce the service life of the contact and even burn the contact. [0003] The traditional power grid connection or electronic circuit connection is usually unable to simulate the impact of poor connection or electric arc on the system. It can only verif...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
Inventor 扬东建
Owner JIANGSU LVSUNNY VISION TECH CO LTD
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