Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for making mask layout minimum physical rule verification file

A production method and rule technology, applied in the field of production of the minimum physical rule verification file of mask layout, can solve problems such as development errors, shorten the development process, etc., and achieve the effect of eliminating hidden errors.

Active Publication Date: 2017-03-29
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In real work, 70% of the development time of engineers is spent on the analysis and input of logic levels and logic operations, and the development cycle (including coding and QA) of the minimum physical rule verification file for the mask layout of a conventional platform is about one week. Traditional The method of making the minimum physical rule verification document of the mask layout is not conducive to shortening the development process, and it is easy to cause development errors caused by engineers' analysis and input errors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for making mask layout minimum physical rule verification file
  • Method for making mask layout minimum physical rule verification file
  • Method for making mask layout minimum physical rule verification file

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] like figure 2 As shown, an embodiment of the present invention is implemented under the LINUX system, including:

[0021] 1) According to the mask layout design document, the EB generation calculation formula file is produced, and the EB generation calculation formula file provides the original hierarchical information for generating the minimum physical rule verification document of the mask layout;

[0022] The calculation formula file generated by the EB is based on the layer information (mask number, mask name, layer number, logic operation formula, line width / spacing) in the mask layout design document and uses the mask number, mask name, logic operation formula , line width, and spacing are listed in order to provide the original hierarchical information for generating the minimum physical rule verification file of the mask layout;

[0023] The following is the content of an embodiment of the calculation formula file generated by EB:

[0024] #MASK_NO MASK_NAME...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for manufacturing a mask layout minimum physical rule verification file. The method is implemented in a LINUX system and comprises the steps of manufacturing an EB generating calculation file according to a mask layout design document; utilizing an analyzer to finish analysis on layer operation, and obtaining layer and digital information in the layer operation; storing every line of layer operation information in the EB generating calculation file to a layer general table; analyzing every element of logic operation in the EB generating calculation file, and forming the rule verification file; outputting checking instructions and original layer detection information to the rule verification file, and if the rule verification file is still provided with original layer information, returning and executing the second step until the rule verification file is no longer provided with the original layer information; optimizing the rule verification file logic operation, and merging expression analysis. The mask layout minimum physical rule verification file can be generated automatically through the method, a workload of manufacturing the rule verification file can be saved, and encoding accuracy can be improved.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for making a mask layout minimum physical rule verification file. Background technique [0002] EBslit check is to check whether the mask layer (mask layer) of each layer still meets the basic design rules (minimum width, minimum space) after the Logic Operation (hierarchical logic calculation). Usually, the development process of the mask layout minimum physical rule verification file is as follows: figure 1 As shown, two parts of information are required to be input: A. logic calculation generation formula; B. minimum design rule information; to form the mask layout minimum physical rule verification file. A complete mask layout minimum physical rule verification file mainly includes: physical verification file environment variable establishment part, 2-level input part, logic calculation generation part, design rule part; then add file name, attention point...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F9/44
Inventor 徐靓张紫弘张兴洲倪凌云孙长江
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products