Secondary electric power supply single event effect test method

Abstract

The invention relates to the technical field of power supply single event effect tests, and discloses a secondary electric power supply single event effect test method. The method comprises the following steps: the step S1 in which after a control signal is received by a DSP processing module, an A / D conversion module and a FPGA module are started; the step S2 in which the A / D conversion module is used to acquire a voltage signal inputted by a tested secondary electric power supply, and perform analog-to-digital conversion on the acquired voltage signal and then input the converted voltage signal to the FPGA module, wherein the voltage signal inputted by the tested secondary electric power supply is triggered by single event irradiation; the step S3 in which the FPGA module is used to process the received voltage signal, and judge whether fluctuation exists in the voltage signal inputted by the tested secondary electric power supply according to the processed and obtained signal, and if fluctuation exists in the voltage signal inputted by the tested secondary electric power supply, then the received voltage signal is inputted to a DSP processing module; and the step S4 in which the DSP processing module is used to process the received signal and then send the processed signal to an upper computer for display. According to the invention, the influences of a high-density single event on the secondary electric power supply can be detected effectively and sensitively.

Description

technical field [0001] The invention relates to the technical field of power supply single event effect testing, in particular to a secondary power supply single event effect testing method. Background technique [0002] Publication No. is CN102332307 in the Chinese patent application that proposed a kind of test SRAM type FPGA single event effect test system and method, this test system comprises: SCM processor, RS232 interface circuit, USB interface circuit, test FPGA and storage unit, can use Based on the fault injection test of the configuration memory of SRAM FPGA and BRAM, realize the single event function interruption detection, single event lock detection and single event upset detection of SRAM FPGA, including single event upset detection of configuration memory area, BRAM and flip-flop. [0003] The existing technology similar to the above-mentioned test system can effectively detect the FPGA single event effect, but cannot test the influence of the single event on...

AI Technical Summary

Problems solved by technology

[0003] The existing technology similar to the above-mentioned test system can effectively detect the single event effect of FPGA, but it cannot test the influence of single event on the secondary power supply, and it cannot realize the output of real-time data for high-density single event flow

For places with high real-time requirements, this design cannot meet the actual needs

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