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Method for measuring particle accelerator beam position

A particle accelerator and beam position technology, which is applied in measuring devices, radiation measurement, X/γ/cosmic radiation measurement, etc., can solve the problems of signal network signal acquisition and processing gain inconsistency, position calculation result error, etc., to eliminate Noise, effects of improving measurement accuracy

Active Publication Date: 2014-05-21
SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI +1
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AI Technical Summary

Problems solved by technology

[0007] Since the insertion loss of the signal network and the inconsistency of the acquisition and processing gain of the signal inevitably exist in the four channels, the above processing method is to perform signal processing on each channel separately, so this problem cannot be solved, which will lead to errors in the position calculation results

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  • Method for measuring particle accelerator beam position
  • Method for measuring particle accelerator beam position
  • Method for measuring particle accelerator beam position

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Embodiment Construction

[0021] Below in conjunction with the drawings, preferred embodiments of the present invention are given and described in detail.

[0022] The present invention is a method for measuring the beam position of a particle accelerator, which comprises the following steps:

[0023] Step S1, perform band-pass sampling on the N electrode signals output by the N electrodes of the strip beam position probe when the beam passes through the probe through N channels, and perform band-pass sampling on the N electrode signals through the RF front-end before sampling bandpass filtering, wherein each electrode signal contains M different fundamental mode signals;

[0024] In step S2, N electrode signals are formed into an M*N matrix X, wherein M different fundamental mode signals of each electrode signal are used as column vectors, and principal component analysis is performed on the matrix X, that is, the matrix X Perform matrix singular value decomposition (SVD decomposition) to obtain the ...

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Abstract

The invention relates to a method for measuring a particle accelerator beam position. The method for measuring the particle accelerator beam position includes: step S1, sampling N electrode signals of N electrodes of a stripe beam position probe through N channels when the beam passes through the probe; step S2, making up an M*N matrix X for the N electrode signals, and analyzing the principal components of the matrix X; step S3, calculating to obtain beam signal induction amplitudes which are corresponding to the N electrodes one by one, and outputting the N beam signal induction amplitudes through the N channels; step S4, comparing the N beam signal induction amplitudes output from the N channels and calculating to obtain a position signal of the beam. According to the method for measuring the particle accelerator beam position, the electrode signals of the electrode probes are formed into the matrix and are processed simultaneously through a principal component analysis method, and accordingly the noise of each electrode signal is eliminated effectively, and the beam position measuring precision is effectively improved.

Description

technical field [0001] The invention relates to the field of accelerator physics beam diagnosis, in particular to a method for measuring the beam position of a particle accelerator. Background technique [0002] For multi-electrode beam position detectors, the figure 1 Strip beam position detector 1 (probe) (BPM) with four electrodes A, B, C, D on the linear electron accelerator shown as an example ( figure 1 The mark "1" in the middle indicates the beam along the direction passing through the paper), and its design frequency reaches hundreds of megahertz. In order to obtain the position signal when the beam cluster passes, the signals output by the four electrodes of the probe need to be processed separately Afterwards, do the difference ratio sum operation such as formulas (1) and (2), so as to obtain the position information X and Y in the horizontal and vertical directions. [0003] X=k X (B-D) / (B+D) (1); [0004] Y=k y (A-C) / (A+C) (2); [0005] Among them, k X 、k...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/29
Inventor 赖龙伟冷用斌阎映炳陈之初
Owner SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
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