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TFT-LCD Mura defect machine vision detecting method based on B spline surface fitting

A technology of machine vision inspection and spline surface, which is applied in the direction of optical testing flaws/defects, instruments, optics, etc. It can solve the problems that Mura defects cannot be accurately segmented and the brightness of the image background is uneven, so as to solve the problems of poor real-time performance, The effect of overcoming the inaccurate segmentation of Mura defects and the standardization of grade division

Inactive Publication Date: 2014-05-14
SICHUAN ENTRY EXIT INSPECTION & QUARANTINE BUREAU OF THE PEOPLES REPUBLIC OF CHINA
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Problems solved by technology

[0005] The present invention aims to solve the problem that mura defects cannot be accurately segmented due to the uneven brightness of the image background, and proposes a machine vision detection method for TFT-LCD mura defects based on B-spline surface fitting. By establishing a set of TFT-LCD Mura defect detection system and detection process, using advanced digital image processing technology, bi-cubic B-spline surface fitting technology, to achieve accurate and rapid detection of TFT-LCD Mura defects

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  • TFT-LCD Mura defect machine vision detecting method based on B spline surface fitting
  • TFT-LCD Mura defect machine vision detecting method based on B spline surface fitting
  • TFT-LCD Mura defect machine vision detecting method based on B spline surface fitting

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Embodiment Construction

[0037] The technical scheme of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0038] The idea of ​​the present invention is to use the B-spline surface fitting method to fit a background image, which can represent the image to the greatest extent through most of the points on the preprocessed TFT-LCD image. Grayscale change trend, and then subtract the background image from the preprocessed TFT-LCD image, so as to obtain an image without a background with uneven brightness, and then accurately detect Mura defects. The hardware system and the specific implementation method of the method will be introduced in detail below.

[0039] according to figure 1 as well as figure 1In the digital part, the hardware part of the Mura defect detection system mainly includes the following parts. 1 represents the dark room, which is used to control the ambient light to filter out the impact of external light on image acquisition. In a...

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Abstract

The invention discloses a TFT-LCD Mura defect machine vision detecting method based on B spline surface fitting and belongs to the field of LCD display defect detecting. The method includes: using a CCD camera to collect the grayscale image of a lighted to-be-detected LCD; filtering the original image; extracting an interested area; using double three-time B spline surface fitting to fit an image background; using the original image to subtract the background image so as to obtain the image with the background, with uneven brightness, being removed; using a Canny operator to detects Mura defects; determining defect level. The method has the advantages that the method is reliable, high in accuracy and time saving in calculation.

Description

technical field [0001] The invention relates to the field of flat panel display manufacturing industry and liquid crystal display defect detection, in particular to the field of machine vision detection of mura defects on TFT-LCD. Background technique [0002] There are more than 100 production processes in the production process of TFT-LCD, and the production processes are various and complicated. Although most of the production processes are very mature and each production process has strict quality control, the mass production process of TFT-LCD is still A certain number of display imperfections are inevitable. There are many kinds of TFT-LCD display defects. According to the contrast between the defect and the background, these defects can be divided into the following categories: bright point defect, dark point defect, bright line defect, dark line defect, Mura defect (Mura is Japanese, The original meaning is dirty and stained, and now it is a special term in the flat...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13G01N21/88
Inventor 李坤李辉卢小鹏
Owner SICHUAN ENTRY EXIT INSPECTION & QUARANTINE BUREAU OF THE PEOPLES REPUBLIC OF CHINA
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