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Raman spectrum test probe and manufacturing method thereof

A technology for testing probes and Raman spectroscopy, which is applied in the field of optical detection, can solve the problems of TERS technology research and application promotion difficulties, and achieve the effect of simple structure, regular distribution, and easy control of shape

Inactive Publication Date: 2014-03-26
FUZHOU PHOTOP QPTICS CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These difficulties have brought great difficulties to the research and application of TERS technology

Method used

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  • Raman spectrum test probe and manufacturing method thereof
  • Raman spectrum test probe and manufacturing method thereof
  • Raman spectrum test probe and manufacturing method thereof

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Embodiment Construction

[0021] The present invention will be further described below in conjunction with the drawings and specific embodiments.

[0022] The Raman spectroscopy test probe based on TERS (tip enhanced Raman spectroscopy) technology of the present invention includes a substrate and an array of nano metal pillars, wherein the test surface of the substrate is a polished surface, and the array of nano metal pillars are arranged on the polished surface; The top of each column of the array nano metal column is a taper tip structure.

[0023] Specific, such as figure 1 In the first embodiment shown, a multimode optical fiber is used as the substrate, and the end surface of the multimode optical fiber substrate 2 is polished, and the polishing surface shape is controlled above λ / 100. The polishing surface is distributed with an array of nano metal pillars 1, and each pillar The top end is a tapered needle tip structure. The array nano metal pillar 1 in this embodiment is made of a 200 nm thick metal...

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Abstract

The invention relates to the optical detection field, and discloses a Raman spectrum test probe. The Raman spectrum test probe comprises a substrate and a plurality of array nano metal columns, wherein the substrate test surface is a polished surface, and the array nano metal columns are arranged on the polished surface; the top of each of the array nano metal columns is of a tapered needle tip structure. The invention also discloses a method for manufacturing the Raman spectrum test probe. The method comprises the technological procedures of polishing, coating, masking, etching, corroding and mask removing, and the manufacturing cost is low. The TERS (Tip-enhanced Raman spectrum) technology-based Raman spectrum test probe provided by the invention is simple in structure, and in comparison with a probe with a single tip, the Raman spectrum test probe has bigger detection area and can be coupled with laser more conveniently; photolithographic mask and metal corrosion technologies are used for manufacturing the Raman spectrum test probe, so that the manufacturing cost is low, the shape of the array nano metal columns with tip structures is easy to control, and the distribution of the array nano metal columns is regular.

Description

Technical field [0001] The invention relates to the field of optical detection, in particular to a Raman spectrum test probe and a manufacturing method thereof. Background technique [0002] Raman spectroscopy is a kind of molecular vibrational spectrum, which can reflect the characteristic structure of molecules. However, the Raman spectrum signal is usually very weak, and its intensity is only 10% of the incident light intensity. -10 . Therefore, the detection of Raman spectroscopy in specific applications usually needs to rely on a certain enhancement effect to increase the intensity of the Raman spectrum. [0003] SERS (Surface-Enhanced Raman Scattering) effect is a surface enhancement effect related to rough surfaces. After surface roughening of metals such as gold, silver and copper, the Raman spectrum signal of the surface molecules can be enhanced by 6 orders of magnitude. It can be seen that the SERS effect can greatly enhance the Raman signal of surface molecules. How...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65
Inventor 吴砺凌吉武赵振宇林磊卢秀爱张杨张新汉
Owner FUZHOU PHOTOP QPTICS CO LTD
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