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Storage unit of flash memory and forming method

A technology of storage unit and flash memory, which is applied in the direction of electrical components, electric solid-state devices, circuits, etc., can solve the problems of larger flash memory devices, lower bit density of flash memory, lower bit cost, etc., to achieve reduced area, lower bit cost, The effect of increasing the bit density

Active Publication Date: 2016-02-17
SEMICON MFG INT (SHANGHAI) CORP
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AI Technical Summary

Problems solved by technology

[0010] However, there is a waste of space in the BiCS structure of the existing flash memory, resulting in a decrease in the bit density of the flash memory, an increase in the volume of the flash memory device, and a corresponding reduction in the bit cost. The manufacturing cost required for the storage space is a feature that reflects the cost of the storage device

Method used

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  • Storage unit of flash memory and forming method
  • Storage unit of flash memory and forming method
  • Storage unit of flash memory and forming method

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Embodiment Construction

[0056] The inventors found that in the existing BiCS structure of flash memory, several layers of polysilicon layers in the control gate layer of flash memory are on the step region of the semiconductor substrate, from the position close to the array region to the outside of the array region from top to bottom layer by layer Incrementing forms a ladder shape, which causes a waste of space in the storage unit of the flash memory, thereby increasing the area of ​​the storage unit, thereby reducing the bit density of the flash memory and increasing the bit cost of the flash memory.

[0057] In order to reduce the area of ​​the storage unit of the flash memory, thereby increasing the bit density of the flash memory and reducing the bit cost of the flash memory, the inventor provides a storage unit of the flash memory, including:

[0058] A semiconductor substrate, the semiconductor substrate includes an array area and a step area, the step area is on both sides of the array area; a...

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Abstract

A flash memory storage unit and a forming method, wherein a flash memory storage unit includes: a semiconductor substrate, the semiconductor substrate includes an array area and a step area, the step area is on both sides of the array area; An isolation layer, a bottom selection gate and a bottom dielectric layer on the bottom surface; a control gate layer located on the surface of the bottom dielectric layer, the control gate layer also includes: several polysilicon layers and several interlayer dielectrics located on the surface of each polysilicon layer layer; a memory plug array with a thickness of the control gate layer that runs through the array area; several layers of polysilicon layers located in the control gate layer in the step area, decreasing layer by layer from the bottom to the top to form a ladder, each level of the ladder The projection arrangement of the steps on the semiconductor substrate is linear, and the linear shape is parallel to the boundary between the array area and the step area. The storage unit of the flash memory provided by the embodiment of the present invention improves the bit density of the flash memory and reduces the bit cost.

Description

technical field [0001] The invention relates to a semiconductor device and a forming method thereof, in particular to a storage unit of a flash memory and a forming method thereof. Background technique [0002] In recent years, the development of flash memory (flash memory) is particularly rapid. The main feature of flash memory is that it can keep stored information for a long time without power on; and it has the advantages of high integration, fast access speed, easy erasing and rewriting, etc., so it has been widely used in many fields such as microcomputer and automatic control. a wide range of applications. [0003] In order to further increase the bit density of flash memory and reduce the bit cost (bitcost), a low-cost three-dimensional stacked structure (Bit-CostScalable, referred to as BiCS) technology of flash memory has been further developed, please refer to figure 1 , is a schematic cross-sectional structure diagram of a memory cell of an existing flash memor...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/115H01L21/8247H10B69/00
Inventor 何其旸孟晓莹
Owner SEMICON MFG INT (SHANGHAI) CORP
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