Linear defect repairing method of liquid crystal display array substrate

Abstract

The invention provides a linear defect repairing method of a liquid crystal display array substrate. A liquid crystal array substrate comprises scanning lines, data lines staggered with scanning lines, common electrode lines parallel with the scanning lines and a plurality of pixel units limited by the scanning lines and the data lines in a crossed manner. Each pixel unit comprises a thin film transistor and a pixel electrode. Each thin film transistor comprises a grid formed along with the scanning lines, a source connected with the data lines and a drain connected with the pixel electrodes. Common electrode lines of adjacent pixel units are connected through a connecting line. When scanning line breakage or scanning line and common electrode short circuit of the array substrate occurs, a part of dependent common electrode line areas can be separated or scanning lines can be isolated, then a laser repairing machine can be used to communicate two ends of drains of adjacent pixel units with scanning lines and common electrode lines respectively so as to complete repairing. Though a few pixel units lose, repairing success rate can be increased, and cost can be saved.

Description

technical field [0001] The invention relates to a method for repairing line defects of a liquid crystal display array substrate. Background technique [0002] Such as figure 1 with figure 2 Shown is a schematic plan view of an existing common liquid crystal display device. The existing liquid crystal display device includes an array substrate 10 and a color filter substrate 20 facing each other, and a liquid crystal interposed between the array substrate 10 and the color filter substrate 20 (not shown in the figure). ), each pixel unit 11 of the array substrate 10 includes: criss-cross data lines 12 and scan lines 13, storage capacitor lines 14 (abbreviated as COM lines), transistors 15, and pixel electrodes 16. The pixel electrodes 16 have effective light-transmitting Area 17, the pixel aperture ratio refers to the light passing through the array unit 11 after excluding the wiring areas such as the data line 12, the scanning line 13, the storage capacitor line 14 (referr...

AI Technical Summary

Problems solved by technology

[0003] In the process of actually fabricating the array substrate, such as image 3 As shown, the short circuit between the scanning line (gate line) 12 and the common electrode line (Com line), or the occurrence rate of the open circuit defect of the scanning line (gate line) is relatively high at about 0.5%, which directly affects the yield of the product

[0004] Because the phenomenon of defect lighting is a horizontal line, and sometimes foreign objects appear on the line, because there is no reserve line for continuous detours, so this kind of defect cannot be repaired at present

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