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Spectrum test device and method

A spectrum test and spectrum technology, which is applied in the field of spectrum test, can solve the problems that the light source cannot be tested directly, and the spectrum takes a long time, so as to reduce the cost and avoid the effect of device test light source

Active Publication Date: 2013-07-24
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] The embodiment of the present invention provides a spectrum testing device and method to solve the problem in the prior art that the traditional backlight spectrum testing method cannot directly test the light source and take a long time to obtain its spectrum

Method used

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  • Spectrum test device and method
  • Spectrum test device and method

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Embodiment Construction

[0030] Embodiments of the present invention design a spectrum testing device and method, which can be directly used to test the spectrum, and can solve the problem that the traditional backlight spectrum testing method can only test the spectrum of the finished backlight, and cannot directly test the light source. The problem of spectrum, and the problem that it takes a long time to obtain the spectrum of the light source through the manufacturer, and the cost of testing the light source through advanced devices is too high.

[0031] Preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings.

[0032] The spectrum testing device designed in the embodiment of the present invention includes:

[0033] Integrating sphere 501 is hollow and has a light outlet on the top, and the inner wall is coated with a diffuse reflection layer that diffuses uniformly at each point to evenly disperse the light;

[0034] The light source 5...

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Abstract

The invention discloses a spectrum test device and a spectrum test method. The device comprises an integrating sphere (501), a light source (502), a baffle (503) and a test lens (504), wherein the integrating sphere (501) is hollow, the top of the integrating sphere (501) is provided with a light outlet, the inner wall of the integrating sphere (501) is coated with a diffuse reflection layer, and diffusion of all points of the diffuse reflection layer is uniform to evenly diffuse light rays; the light source (502) is arranged in the center of the integrating sphere (501) and emits the light rays when powered on; the baffle (503) is located between the light outlet and the light source (502) to prevent the light rays emitted from the light source (502) from shooting out from the light outlet before being diffused; and the test lens (504) is located above the light outlet and used for testing the light rays from the light outlet and obtaining the spectrum of the light rays to solve the problems that in a traditional backlight spectrum test method, a light source cannot be directly tested and time used in obtaining the spectrum is long.

Description

technical field [0001] The invention relates to the technical field of spectrum testing, in particular to a spectrum testing device and method. Background technique [0002] When manufacturing liquid crystal displays, it is necessary to test the backlight spectrum to obtain the backlight spectrum and match it with the color filter spectrum of the panel. For the white light and RGB (red, Green, Blue, red) The color coordinates and color gamut of the green and blue) screen are simulated and predicted. According to the difference between the simulated color coordinates and the central color coordinates (MNT: 0.313, 0.328; TV: 0.280, 0.290), the LED (Light Emitting Diode, luminescent The central color block of the diode) light bar determines the light source information such as LED phosphor powder that needs to be used to meet the color gamut and other parameters. When analyzing the liquid crystal display, the optical parameter information such as the fluorescent powder of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28
CPCG01J3/02G01J3/28G01J3/0254G01J3/506
Inventor 颜凯鹿堃王贺陶布占场
Owner BOE TECH GRP CO LTD
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