Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Simultaneously framing and scanning ultra-high-speed photoelectricity shooting system

A spectroscopic system and ultra-high-speed technology, used in high-speed photography, photography, photogrammetry/video surveying, etc., can solve the problem of difficulty in further improving the frequency and time resolution of photography, and improve the frequency of photography and the efficiency of experiments. , the effect of broad application prospects

Inactive Publication Date: 2013-07-10
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
View PDF3 Cites 28 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a novel simultaneous framing and scanning imaging ultra-high-speed photoelectric photography system for the defects that the imaging frequency and time resolution of the current simultaneous framing and scanning imaging system based on the optical mechanical structure are difficult to further improve

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Simultaneously framing and scanning ultra-high-speed photoelectricity shooting system
  • Simultaneously framing and scanning ultra-high-speed photoelectricity shooting system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] The present invention will be further described below in conjunction with the accompanying drawings.

[0025] figure 1 Shown is the overall composition block diagram of the simultaneous framing and scanning ultra-high-speed photoelectric photography system of the present invention, including a relay imaging unit, an optical spectroscopic system, a scanning imaging system, a framing imaging system, a high-voltage power supply and a pulse generation module, a precision delay and control The system and control computer are divided into seven parts. The relay imaging unit includes a main objective lens, a reticle, and an electromagnetic shutter; the optical beam splitting system includes a beam splitting prism, a beam splitting objective lens, a plane mirror, a beam splitting pyramid, and a beam splitting hexagonal pyramid; the scanning imaging system includes a scanning slit, a picosecond time-resolved Stripe image transformation tube, high-speed and high-linearity scanni...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a simultaneously framing and scanning ultra-high-speed photoelectricity shooting system. The system comprises a relaying imaging unit, an optical beam splitting system, a scanning imaging system, a framing imaging system, a precise delay and control system, a high-voltage power supply and pulse generating module and a control computer. An object to be measured is synchronously imaged to the scanning imaging system and the framing imaging system through the relay imaging unit and the optical beam splitting system, and synchronous imaging is controlled by the precise delay and control system and the high-voltage power supply and pulse generating module. The simultaneously framing and scanning high-speed photoelectricity shooting system is wide in application prospect in the field of ultra-high-speed process testing, can absolutely provide high-quality digital images for researches with ultra-fast processes of electromagnetic implosion plasma discharging, controlled nuclear fusion, interaction of lasers and substances, high-voltage spark discharging, material micro jet and interface instability within nanosecond-to-10<-8> second .

Description

technical field [0001] The invention belongs to the technical field of high-speed photographic testing, and in particular relates to a photoelectric photographic system capable of simultaneously realizing framing imaging and scanning imaging. The system can obtain framing of the ultra-high-speed transient process at the same time base and the same space base in one experiment. and scanned images. Background technique [0002] High-speed photography technology is an important test method for studying high-speed motion processes. For the measurement of transient events in different time-varying processes, photography techniques with different photography frequencies and time resolutions are required. According to the two important indicators of shooting frequency and time resolution, high-speed photography technology can be divided into three categories: low speed, medium speed, very high speed and ultra high speed; according to the imaging method, it can be divided into optic...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G03B39/00G02B27/10G01C11/00
Inventor 温伟峰李泽仁李剑刘宁文张登洪彭其先钱伟新畅里华赵新才何徽
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com