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Spinneret plate microscopic examination instrument

A technology of a microscope and a spinneret is applied in the field of a spinneret microscope, which can solve the problems of low work efficiency and high labor intensity, and achieve the effects of convenient dredging, convenient operation and low manufacturing cost.

Active Publication Date: 2012-12-19
CHANGZHOU HUAFANG TEXTILE INSTR CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the detection and dredging of the spinneret holes are carried out separately. The spinneret is detected on the detector, and after the information of the spinneret clogging or erosion is obtained, the spinneret is removed to perform the dredging operation, so it needs to be repeated. Take the spinneret up and down, the labor intensity is high and the work efficiency is low

Method used

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  • Spinneret plate microscopic examination instrument
  • Spinneret plate microscopic examination instrument
  • Spinneret plate microscopic examination instrument

Examples

Experimental program
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Embodiment 1

[0017] See Figure 1 to Figure 5 , the present embodiment has a base 1, a pillar 2 fixed on the base 1, a cantilever 3 that can be lifted on the pillar 2, a coaxial microscope 4 with a CCD camera installed on the cantilever 3, and can move forward and backward on the base 1 The workbench 5 further includes a workbench adjusting device 6 and a light source 13 . An elevating rack and pinion pair 14 is arranged between the pillar 2 and the cantilever 3, and the gear 14-1 of the elevating rack and pinion pair 14 is driven by the hand wheel 15 to rotate, and the rack 14-2 drives the cantilever 3 to elevate. The cantilever 3 is locked on the support 2 by the locking screw 16 .

[0018] The workbench 5 has a base plate 5-3, a support plate 5-2 slidably connected to the base plate 5-3, and a table 5-1 slidably connected to the support plate 5-2. The platen 5-1, the supporting plate 5-2 and the bottom plate 5-3 are all provided with light-transmitting holes; the bottom side of the pl...

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Abstract

The invention discloses a spinneret plate microscopic examination instrument which is provided with a base, a support, a suspension arm, a coaxial microscope, a working bench, a working bench regulating device and a light source, wherein the working bench is provided with a base plate, a supporting plate and a bench plate; the working bench regulating device comprises a regulating shaft, a hollow shaft, a front rotary knob, a rear rotary knob, a left rotary knob, a right rotary knob, a front gear rack pair, a rear gear rack pair, a left gear rack pair and a right gear rack pair, thus the bench plate can move two-dimensionally; a spray pipe frame is fixed on the suspension arm; a spray pipe of a spray nozzle is fixedly arranged on the spray pipe frame positioned dead ahead the coaxial microscope; a spacing element is fixed on the front end of the guide rail; and the light source is arranged on a light hole of the base. According to the invention, manual operation is adopted, the structure is simple and compact; the instrument is small in volume; the manufacturing cost is low; and after a hole is examined, if the hole is found to be a fault hole, the fault hole can be dredged, and the working efficiency is improved greatly.

Description

technical field [0001] The invention relates to a spinneret microscope inspection instrument. Background technique [0002] The spinneret is an important part of the chemical fiber spinning machine. During the use of the spinneret, the spinneret holes will be blocked or corroded, resulting in faulty holes. Therefore, before and during use, it is necessary to use testing instruments to check the The spinneret hole of the wire plate is inspected, and if there is a faulty hole, it needs to be dredged. The invention patent application with Chinese application number 201010159547.8 discloses a spinneret detector, including a base, a support device, a light source, a light detection device, a transmission device and a computer, and the support device includes a rotating base and a linear motion base; The transmission device includes a first transmission device and a second transmission device; the first transmission device is connected to the rotating base; the second transmissio...

Claims

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Application Information

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IPC IPC(8): G01M11/00D01D4/04
Inventor 孙伟平
Owner CHANGZHOU HUAFANG TEXTILE INSTR CO LTD
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