Automatic measuring and analyzing instrument for crop leaf area information

A technology for measuring and analyzing leaf area, applied in measuring devices, instruments, and optical devices, etc., it can solve the problems of not meeting the needs of mass measurement, low measurement accuracy, and cumbersome measurement work, so as to achieve a simple, fast, and efficient measurement process. Fast and accurate effects

Inactive Publication Date: 2012-12-05
HUAZHONG AGRI UNIV
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  • Abstract
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AI Technical Summary

Problems solved by technology

[0013] The technical problem to be solved by the present invention is to provide an automatic measurement analyzer for crop leaf area information, which overcomes the cumbersome measurement work, slow measurement speed, low measurement accuracy, and low work efficiency in the prior art of crop leaf area measurement. To adapt to the technical defects needed for large-scale measurement, obtain the green leaf area, yellow leaf area, and green leaf index information of crop leaves while quickly and accurately obtaining the total leaf area

Method used

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  • Automatic measuring and analyzing instrument for crop leaf area information
  • Automatic measuring and analyzing instrument for crop leaf area information
  • Automatic measuring and analyzing instrument for crop leaf area information

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Experimental program
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Effect test

Embodiment

[0045] 1) Stability analysis of green leaf area extraction

[0046] Will (length 50mm, width 50mm, area 2500mm 2 ) of green paper, fed to the analyzer for automatic measurement, repeated 10 times, the results are shown in the table below:

[0047] Table 1 Green leaf area extraction stability test results

[0048]

[0049] It can be seen from the analysis that the system repeats the measurement of a single sample 10 times with a relative error mean of 1.19% and a standard deviation of 1.27%. The measurement repeatability of the system is good and meets the design requirements of this system.

[0050] 2) Error analysis of green leaf area extraction

[0051] Select 30 representative germplasm resource rice plants (tiller stage), cut off the leaves, use analyzer and scanner to scan, leaf extract and area calculation respectively. Here is a brief introduction to the scanner (the scanner uses BenQ Scanner 8800) measurement method, paste the cut leaf on the A4 white paper, and ...

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Abstract

The invention discloses equipment for measuring and analyzing the total leaf area, green leaf area, yellow leaf area and the green leaf index of a crop in a high-precision and high-speed manner. The instrument comprises a leaf transmission device, an image acquisition device, a PLC (Programmable Logic Controller) and a computer system. According to the invention, a machine vision technology is adopted to dynamically acquire the leaf color information of the crop, and the leaves of the crop can be quickly measured at the same time; the defect that a current measuring method can not quickly and efficiently measure the total leaf area, green leaf area and yellow leaf area of the crop is overcome; the measuring process adopts a feeding type flow operation mode, and the operation is convenient; the software compatibility is good; and the foreign part can be automatically removed, and the green leaf part and the yellow leaf part can be recognized. Therefore, the leaf color information can be obtained as long as the leaf is sheared down and directly put into the instrument for measuring and analyzing, without pretreatment for the yellow and green parts of the leaf such as trimming.

Description

technical field [0001] The invention relates to a device for rapid recording and analysis of color information such as total leaf area, green leaf area, yellow leaf area, green leaf index (green leaf content percentage) and other color information of agricultural scientific researchers. Background technique [0002] The measurement and analysis of crop leaf surface color information is of great significance to the improvement of crop varieties, especially the yellow-green leaf area information, which affects key results such as crop yield, plant height, and quality. The study of leaf area information is a key step in crop cultivation research. [0003] In the existing measurement and analysis of crop leaf area information, the commonly used methods are dry weight ratio method, punching weighing method, paper cutting weighing method, coordinate paper method, parabola fitting method, coefficient method and regression equation method, planimeter Method, sticker scanning method...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/28
Inventor 杨万能陈国兴谢原城熊立仲
Owner HUAZHONG AGRI UNIV
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