Thermally driven transmission electron microscope grid made of intelligent composite material

Abstract

The invention provides a thermally driven transmission electron microscope grid made of an intelligent composite material. The grid is composed of a driving portion and a support portion, wherein the support portion is a metal ring; the driving portion comprises first slide glass and second slide glass, the first slide glass is a composite material sheet or a rigidity metal sheet, the second slide glass is a composite material sheet, and the first slide glass and the second slide glass are symmetrically arranged relative to a circle center of the metal ring; and one ends of the outer sides of the first slide glass and the second slide glass are fixed on the metal ring through pressing sheets or gluing materials respectively, and one ends of the inner sides of the first slide glass and the second slide glass are not fixed. The transmission electron microscope grid can be used on standardized transmission electron microscope heating stages in various brands and is capable of achieving tilting in an X direction and a Y direction, applying in situ tensile tests to nanometer materials and larger and thicker samples, axially producing larger strain on the samples and achieving high resolution electron microscopic analyses on required zone axes.

Description

technical field [0001] The invention relates to a thermally driven transmission electron microscope sample carrying net of an intelligent composite material, and belongs to the technical field of instrument preparation for material testing. Background technique [0002] Transmission electron microscope is a large-scale modern instrument applied to the microstructure detection of solid matter, and its application fields cover materials, physics, chemistry, biomedicine and other disciplines. It is one of the most powerful research tools for nanotechnology, which is developing rapidly at this stage and has broad application prospects in the future. The resolution of the transmission electron microscope under the current technology has been able to reach the sub-Angstrom size, which can clearly reveal the microstructure information of solid matter from the atomic scale. Commonly used transmission electron microscope grids are mostly metal grids such as copper and molybdenum, or...

AI Technical Summary

Problems solved by technology

Although this method overcomes the problem that the sample cannot be tilted at a large angle in the above two methods, the load and pure axial strain that can be provided by loading the sample through bimetal bending are limited. For traditional TEM that requires a large amount of strain Sample, the deformation of the sample by bimetal bending cannot be guaranteed to be purely axial

[0006] In the above test methods, or the test sample cannot achieve biaxial and large-angle tilting, or the sample size that can be tested is small, the strain that can be generated is limited, and it cannot meet the simple axial tension of large strain

In most cases, it needs to be tilted to meet the positive zone axis observation, or the in-situ deformation study of relatively large traditional TEM samples, and its application is limited

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