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A method for determining contents of potassium element, sodium element, calcium element, silicon element, and magnesium element in nickel oxide

A technology of nickel oxide and elements, which is applied in the preparation of test samples, thermal excitation analysis, material excitation analysis, etc., to achieve the effects of fast measurement, avoiding contamination by impurity elements, and easy operation

Active Publication Date: 2012-10-10
AVIC BEIJING INST OF AERONAUTICAL MATERIALS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] At present, the analytical methods for analyzing nickel oxide include the determination of trace amounts of Cd and Pb elements by polarography, the determination of trace amounts of As and Sb in metallic nickel and nickel oxide by atomic fluorescence spectrometry[3], and the determination of trivalent nickel content in nickel oxide by complexometric titration. , Osamu Kujirai and others used co-precipitation inductively coupled plasma atomic emission spectrometry to determine seven trace impurity elements such as Al, As, Cr, Fe, Ti, V, Zr in high-purity metallic nickel and nickel oxide, without inductance Report on the analysis of potassium, sodium, calcium, silicon and magnesium in nickel oxide by coupled plasma emission spectrometry (ICP-AES)

Method used

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  • A method for determining contents of potassium element, sodium element, calcium element, silicon element, and magnesium element in nickel oxide
  • A method for determining contents of potassium element, sodium element, calcium element, silicon element, and magnesium element in nickel oxide
  • A method for determining contents of potassium element, sodium element, calcium element, silicon element, and magnesium element in nickel oxide

Examples

Experimental program
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Effect test

Embodiment 1

[0053] Measure potassium, sodium, calcium, silicon, and magnesium elements in high-purity nickel oxide, and measure them on the following instruments

[0054] Using JY ULTIMAIIC Inductively Coupled Plasma Emission Spectrometer, the working conditions and analysis lines of the instrument are as follows: incident power 1050W; reflected power<10W; cooling air flow 15L / min; sample lifting volume 1.5mL / min; integration time 5s; elemental analysis line : K766.490nm, Na588.995nm, Ca393.366nm, Si251.611nm and Mg279.553nm.

[0055] (1) The reagents used in the determination process are as follows:

[0056] (1.1), hydrochloric acid I, the density is 1.19g / mL, superior grade or above;

[0057] (1.2), hydrochloric acid II, 1+1, hydrochloric acid I and water are mixed at a volume ratio of 1:1;

[0058] (1.3), nitric acid I, the density is 1.42g / mL, superior grade or above;

[0059] (1.4), nitric acid II, 1+1, mixed with nitric acid I and water at a volume ratio of 1:1;

[0060] (1.5), ...

Embodiment 2

[0091] Measure potassium, sodium, calcium, silicon, and magnesium elements in nickel oxide, and measure them on the following instruments

[0092]Using JY ULTIMAIIC inductively coupled plasma emission spectrometer, the working conditions and analysis lines of the instrument are as follows: incident power: 950W; reflected power: <10W; cooling air flow: 14L / min; sample lifting volume: 1.5mL / min; integration time: 2s; Elemental analysis lines: K766.490nm, Na 588.995nm, Ca393.366nm, Si251.611nm and Mg279.553nm.

[0093] (1) The reagents used in the determination process are as follows:

[0094] (1.1), hydrochloric acid I, the density is 1.19g / mL, superior grade or above;

[0095] (1.2), hydrochloric acid II, 1+1, hydrochloric acid I and water are mixed at a volume ratio of 1:1;

[0096] (1.3), nitric acid I, the density is 1.42g / mL, superior grade or above;

[0097] (1.4), nitric acid II, 1+1, mixed with nitric acid I and water at a volume ratio of 1:1;

[0098] (1.5), sodium ...

Embodiment 3

[0129] Measure potassium, sodium, calcium, silicon, and magnesium elements in nickel oxide, and measure them on the following instruments

[0130] Using JY ULTIMAIIC Inductively Coupled Plasma Emission Spectrometer, the working conditions and analysis lines of the instrument are as follows: incident power 1150W; reflected power<10W; cooling air flow 16L / min; sample lifting volume 1.2mL / min; integration time 10s; elemental analysis Lines: K766.490nm, Na588.995nm, Ca393.366nm, Si251.611nm and Mg279.553nm.

[0131] (1) The reagents used in the determination process are as follows:

[0132] (1.1), hydrochloric acid I, the density is 1.19g / mL, superior grade or above;

[0133] (1.2), hydrochloric acid II, 1+1, hydrochloric acid I and water are mixed at a volume ratio of 1:1;

[0134] (1.3), nitric acid I, the density is 1.42g / mL, superior grade or above;

[0135] (1.4), nitric acid II, 1+1, mixed with nitric acid I and water at a volume ratio of 1:1;

[0136] (1.5), sodium hydr...

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Abstract

The invention provides a method for determining contents of potassium element, sodium element, calcium element, silicon element and magnesium element in nickel oxide. The method capable of effectively dissolving a nickel oxide sample, is a method which can determine the contents of the potassium element, the sodium element, the calcium element, the silicon element and the magnesium element in the nickel oxide with high speed of sample dissolution, high analysis precision, simple and convenient operation as well as high efficiency. Analytical spectral lines selected by the method are as follows: K766.490 nm, Na588.995 nm, Ca393.366 nm, Si251.611 nm and Mg279.553 nm which are on multiple spectral instruments and are not affected by interference of matrix elements and coexisting elements in the nickel oxide; therefore, this method can be applied to almost all inductively coupled plasma atomic emission spectrometers. The method has a wide measurement range with a measurement lower limit being 0.0001% and a measurement upper limit being 0.5% and can satisfy requirements for analyzing the potassium element, the sodium element, the calcium element, the silicon element and the magnesium element in the nickel oxide.

Description

technical field [0001] The method is a method for determining the contents of potassium, sodium, calcium, silicon and magnesium elements in nickel oxide, and belongs to the technical field of alloy element analysis and measurement. Background technique [0002] Nickel oxide is a transition metal oxide, which has been widely used in aerospace, catalysis, battery electrodes, photoelectric conversion materials, etc., and also shows a bright application prospect. With the continuous improvement of nickel oxide preparation technology, the purity of high-quality nickel oxide has also been continuously improved. The contents of potassium, sodium, calcium, silicon and magnesium elements in nickel oxide have an important influence on the performance of nickel oxide. [0003] At present, the analytical methods for analyzing nickel oxide include the determination of trace amounts of Cd and Pb elements by polarography, the determination of trace amounts of As and Sb in metallic nickel ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N21/73
Inventor 李帆叶晓英
Owner AVIC BEIJING INST OF AERONAUTICAL MATERIALS
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