Method by adopting impulse airflow method to grow gallium phosphide (GaP) current extension layer
A technology of current spreading layer and pulsed air flow, applied in crystal growth, single crystal growth, single crystal growth and other directions, can solve the problems of affecting the efficiency and life of LED, reducing light extraction efficiency and so on
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[0020] Such as figure 2 As shown, a distributed Bragg reflection layer 3 , a first-type epitaxial layer 4 , a light-emitting layer 5 and a second-type epitaxial layer 6 are sequentially grown on a GaAs substrate 2 by MOCVD. The distributed Bragg reflection layer 3 is composed of a combination of AlAs, GaAs, AlGaAs, AlInP, GaInP, and AlGaInP. The first-type epitaxial layer 4 is composed of AlAs, GaAs, AlGaAs, AlInP, GaInP, AlGaInP, and is doped with first-type impurities. The light emitting layer 5 is composed of AlAs, GaAs, AlGaAs, AlInP, GaInP, AlGaInP. The second-type epitaxial layer 6 is composed of AlAs, GaAs, AlGaAs, AlInP, GaInP, AlGaInP, and is doped with second-type impurities.
[0021] On the second-type epitaxial layer 6, the metal-organic compound source (MO source) containing gallium atoms, phosphine (PH 3 ) and the dopant source are pulsed into the MOCVD reaction chamber. The GaP current spreading layer 9 is grown by using the first pulse working mode or the ...
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