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Integrated network parameter tester and test method applied to pulse regime

A technology of pulse state and network parameters, applied in data exchange network, digital transmission system, transmission monitoring and other directions, can solve the problems of large size and high cost, and achieve the effect of high test accuracy, good stability and wide working frequency band

Active Publication Date: 2012-07-11
CHINA ELECTRONIS TECH INSTR CO LTD
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Problems solved by technology

[0006] The purpose of the present invention is to aim at the defects of the prior art, to provide an integrated network parameter tester and its test method with high test accuracy and good stability suitable for pulse state, so as to overcome the bulky and high cost of the existing test instruments defects, making network parameter testing more flexible and convenient

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  • Integrated network parameter tester and test method applied to pulse regime
  • Integrated network parameter tester and test method applied to pulse regime
  • Integrated network parameter tester and test method applied to pulse regime

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Embodiment Construction

[0028] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0029] Such as figure 1 As shown, the integrated network parameter tester applicable to the pulse state provided by the present invention includes a built-in pulse generator module and a pulse modulation module connected with the pulse generator module, and the excitation signal source module is connected with the pulse modulation module. The pulse modulation module is connected to the pulse high-power S-parameter test module, the device under test DUT is connected to the pulse high-power S-parameter test module; the pulse high-power S-parameter test module and the local oscillator signal source module are respectively connected to the mixer receiver module, and the frequency mixer The receiver module is connected with the intermediate frequency processing module, and the intermediate frequency processing module is connected with the embedded computer...

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Abstract

The invention belongs to a network test technology, and particularly relates to an integrated network parameter tester and an integrated network parameter test method applied to a pulse regime. The tester comprises a built-in pulse generator module and a pulse modulation module connected with the pulse generator module. An excitation signal source module is connected with the pulse modulation module. The pulse modulation module is connected with a pulse high-power S parameter test module. The pulse high-power S parameter test module and a local oscillator signal source module are connected with a mixing receiver module respectively. The mixing receiver module is connected with an intermediate frequency processing module. The intermediate frequency processing module is connected with an embedded computer module through a digital signal processing module. By the tester and the test method, the shortcomings of large volume and high construction cost of the conventional test instrument are overcome; and network parameters can be flexibly and conveniently tested.

Description

technical field [0001] The invention belongs to the network test technology, and in particular relates to an integrated network parameter tester suitable for pulse state and a test method thereof. Background technique [0002] Microwave complex power devices / components are easy to burn out due to high temperature when performing network parameter testing under the long-term continuous wave excitation signal state, so it is very necessary to obtain the response characteristics of the peak large signal state and reduce the average Power is dissipated to protect the DUT. However, the traditional continuous wave state network parameter test equipment cannot solve this problem, and a network parameter test equipment that can generate pulse modulation excitation signals and receive, process and analyze pulse modulation response signals is needed. [0003] At present, in terms of network parameter testing in the pulse state, there are mainly several schemes such as the external ex...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L12/26H04B17/00
Inventor 曹志英刘丹梁胜利许春卿段飞
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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