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Quantitative measurement method for pulse infrared thermal wave technology

An infrared thermal wave, quantitative measurement technology, applied in the field of pulsed infrared thermal wave technology, achieves the effect of simple measurement, high accuracy and wide application

Active Publication Date: 2012-07-11
CAPITAL NORMAL UNIVERSITY +2
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

For the measurement of thermal diffusivity in the depth direction (or in the direction parallel to the thermal wave), the transmission pulse method is mainly used for measurement at present, while the reflection pulse method has not been used for the measurement of thermal diffusivity.

Method used

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  • Quantitative measurement method for pulse infrared thermal wave technology
  • Quantitative measurement method for pulse infrared thermal wave technology
  • Quantitative measurement method for pulse infrared thermal wave technology

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Embodiment Construction

[0029] In order to better understand the shape, structure and characteristics of the present invention, preferred embodiments will be listed below and described in detail with reference to the accompanying drawings.

[0030] The theoretical basis of the present invention is based on the solution of the one-dimensional heat conduction equation under the excitation of a pulsed plane heat source. For a semi-infinite homogeneous medium, when subjected to a uniform pulsed heat source parallel to the surface of the medium, the heat conduction equation can be simplified as:

[0031] k ∂ 2 T ( x , t ) ∂ x 2 ...

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Abstract

The invention discloses a quantitative measurement method for a pulse infrared thermal wave technology. The method comprises the following steps of: 1, heating the surface of a measured object by using a pulse heating device, continuously observing and recording the temperature field change of the surface of the measured object by using an infrared thermal image device, and acquiring a time sequence thermal wave signal through a computer control and acquisition system to obtain a thermograph sequence of the surface of the measured object; 2, according to the obtained thermograph sequence, extracting temperature reducing data of a defective area and a non-defective area, and comparing logarithmic temperature-logarithmic time curves; 3, setting a separation time point of defective and non-defective area curves in the logarithmic temperature-logarithmic time curves or a previous time point of the separation time point as t1, setting the maximum temperature difference time point of the two curves as t2, and extracting a temperature value or a radiation energy value delta T (0, t1) and delta T (0, t2) corresponding to the two time points; and 4, when two of an interface thermal reflection coefficient R of the defective area, a thermal diffusion coefficient alpha of the measured object and a defect depth L are given, solving the third coefficient by using a formula (4).

Description

technical field [0001] The invention relates to the technical field of non-destructive flaw detection, in particular to a pulsed infrared thermal wave technology, which uses the pulsed infrared thermal wave technology to measure the depth of a defect, the thermal diffusivity or the thermal reflection coefficient of a defect interface under specific conditions. Background technique [0002] Pulse infrared thermal wave non-destructive testing technology is a non-destructive testing technology developed after the 1990s. This method is based on thermal wave theory, by actively applying pulsed thermal excitation to the object to be detected, and using an infrared thermal imager to continuously observe and record the temperature field changes on the surface of the object, and through modern computer technology and image information processing technology for time series Detection, acquisition, data processing and analysis of thermal wave signals to achieve quantitative diagnosis of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/20G01N25/72G01B11/22
Inventor 曾智王迅陶宁冯立春张存林
Owner CAPITAL NORMAL UNIVERSITY
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