Mass production tester and mass production aging test system

A technology of aging test and tester, which is applied in the direction of measuring electrical variables, instruments, measuring electricity, etc., can solve the problems of no aging test function, low mass production efficiency, and many test procedures in the test process, so as to improve test efficiency and save manpower. Cost and effect of reducing test procedures

Inactive Publication Date: 2012-07-04
SHENZHEN NETCOM ELECTRONICS CO LTD
View PDF3 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a mass production tester, aiming to solve the problem that the mass production tester provided by the prior art itself does not have the aging test function, resulting in many testing procedures and low mass production efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Mass production tester and mass production aging test system
  • Mass production tester and mass production aging test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0016] In order to overcome the disadvantages of the mass production tester provided by the prior art, the mass production tester provided by the embodiment of the present invention adds a temperature acquisition unit and an aging test unit on the existing basis, so that the mass production tester has In addition to the mass production test function, it also has the function of aging test.

[0017] figure 1 It is a functional block diagram of the mass production tester provided by the embodiment of the present invention, and for the convenience of description, only the parts related to the embodim...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention is suitable for the technical field of test, and provides a mass production tester and a mass production aging test system, wherein the mass production tester comprises an aging test unit, a plugging port, a temperature collecting unit, a control unit and a power supply unit, wherein the plugging port is used for connecting a test device to be subjected to mass production; the temperature collecting unit is used for collecting the environment temperature around the test device to be subjected to mass production; and the control unit is used for calling a mass production tool to complete the mass production working procedure of the test device to be subjected to mass production through the plugging port after the plugging port is detected to be connected with the test device to be subjected to mass production, then acquires the environment temperature collected by the temperature collecting unit, and when the environment temperature is higher than or equal to the preset temperature, controls an aging test unit to detect the quality of the test device to be subjected to mass production in the aging test. When the mass production tester performs mass production aging test, the test device to be subjected to mass production is not required to be taken down after mass production test and then connected to an individual aging tester, thus the test working procedures are reduced, the test time is shortened, the test efficiency is improved, and the labor cost is saved.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a mass production tester and a mass production aging test system. Background technique [0002] Before electronic products are put into the market, mass production testing and aging testing are generally required. Among them, mass production testing refers to writing corresponding data (such as: manufacturer information, formatting, loading drivers, underlying software, etc.) to the main control chip of the mass-produced product in batches, so that other devices can correctly identify the product to be mass-produced , and make the product to be mass-produced have certain specific functions; aging test refers to the process of simulating various factors involved in the actual use conditions of the product to be aged, so as to carry out corresponding condition strengthening experiments for the aging of the product to be aged. Further understanding the aging condition o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01
Inventor 何宏李志雄尹慧
Owner SHENZHEN NETCOM ELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap