Circuit structure and method for automatically testing analog baseband chip comprising analog-digital converter (ADC) and digital-analog converter (DAC)
A technology for simulating baseband and automatic testing, which is applied in the field of integrated circuit and integrated circuit chip testing. It can solve the problems that the analog output of DAC is not easy to observe statistics, affect the calculation accuracy, and the degree of automation is low, so that the test results are simple and intuitive, and the complexity is reduced. , a wide range of effects
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0055] In order to understand the technical content of the present invention more clearly, the following examples are given in detail.
[0056] see figure 1 and figure 2 As shown, this realizes the circuit structure for automatic testing of analog baseband chips with analog-to-digital converters and digital-to-analog converters, wherein the circuit structure includes a test control function device, and the test control function device includes Sending data storage module, receiving data storage module, low-voltage differential signal conversion module, transmission and stop control module, error calculation module, test result display module, the low-voltage differential signal conversion module and the analog baseband chip low-voltage differential signal The input end and the low-voltage differential signal output end are all connected, the output end of the digital-to-analog converter of the analog baseband chip is connected to the input end of the analog-to-digital conver...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com