Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for eliminating tailing light lines of frame transfer type CCD (charge coupled device) sensor in star image

A frame transfer, in-image technology, applied in image communication, TV, color TV components, etc., can solve problems such as increasing the signal-to-noise ratio of weak and small targets, increasing noise points, etc.

Inactive Publication Date: 2011-09-07
NORTHWESTERN POLYTECHNICAL UNIV
View PDF1 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method uses two-dimensional wavelet decomposition to separate trailing bright lines into low-frequency components and vertical components for detection and elimination respectively, which can avoid the problem of adding new noise points caused by the existing interpolation method, and can increase the signal of weak and small targets. noise ratio

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for eliminating tailing light lines of frame transfer type CCD (charge coupled device) sensor in star image
  • Method for eliminating tailing light lines of frame transfer type CCD (charge coupled device) sensor in star image
  • Method for eliminating tailing light lines of frame transfer type CCD (charge coupled device) sensor in star image

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] 1. Establish the model of the trailing bright line of the frame transfer CCD sensor.

[0036] The brightness of the stars in the field of view of the starry sky image is too high, which causes electron overflow in the entire row or column of the CCD sensor. The trailing area is usually a straight line that passes through the center of a bright star and runs through the row or column direction of the entire image. The following takes the vertical bright line as an example to illustrate the elimination method; the original image is divided into two parts, one part is the image without trailing, and the other part is the trailing bright line. i is the row coordinate of the pixel in column j, and the star light source is constant during the exposure period and transfer time. During the exposure period τ, the number of photons accumulated by pixel i is:

[0037] N' i，j =kτA i，j (1)

[0038] In the formula, A i，j is the radiation intensity on pixel i, and k is a cons...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for eliminating tailing light lines of a frame transfer type CCD (charge coupled device) sensor in a star image, which is used for solving the technical problem that the SNR (signal to noise ratio) of a weak and small target is reduced due to increment of noise points in an existing method for detecting tailing light lines. The technical scheme is as follows: a two-dimensional WT (wavelet transform) method is adopted to decompose an original image into low-frequency sub-images and vertical, horizontal and diagonal high-frequency sub-images, and CCD tailing is vertical or horizontal light lines, so that the low-frequency sub-images and the vertical or horizontal sub-images comprise the light lines, thus only eliminating the light lines of the sub-images and effectively reserving other detailed information; a detection method based on array grey and singular values is used in the process of detection, thus the complexity is low; and the influences on excessive light stars are considered sufficiently in the process of elimination, thus the estimation of grey intensity of the light lines is more accurate. Because an interpolation method is not used, the SNR of the weak and small target is not reduced; and on the contrary, the SNR of targets on the tailing light lines is increased by over 5dB on average.

Description

technical field [0001] The invention relates to a method for eliminating trailing bright lines of a CCD sensor, in particular to a method for eliminating trailing bright lines of a frame transfer type CCD sensor in a starry sky image. Background technique [0002] When the frame-transfer CCD sensor is shooting the background image of the starry sky, when there are too bright stars in the field of view, there will be trailing bright lines, which have a serious impact on target detection. The existing methods for eliminating the trailing bright lines mainly There are: change the CCD sensor hardware design and image processing method. [0003] The document "Automatic Detection Algorithm for Bright Lines in Star Maps, Application of Photoelectric Technology, 2009, Vol.24(4), p41-44" discloses an automatic removal algorithm for trailing bright lines in star maps. This method utilizes the frequency-domain isotropic property of star imaging and the self-registration property of Fo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/357
Inventor 张艳宁姚睿孙瑾秋张永鹏张臻段锋
Owner NORTHWESTERN POLYTECHNICAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com