Method for testing coating infrared emittance with spectral reflectance method

A technology of infrared emissivity and spectral reflectance, applied in the measurement of color/spectral characteristics, etc., can solve the problems of inability to eliminate errors, harsh test conditions, inability to measure emissivity, etc., to eliminate errors, loose test conditions, and test equipment. simple effect

Inactive Publication Date: 2011-06-01
FAW GROUP
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Problems solved by technology

[0002] According to different test principles, emissivity measurement methods are usually divided into calorimetry, reflectance method, radiant energy method and multi-wavelength measurement method; The standard sample needs to be heated, the test conditions are harsh, and the error caused by the reflection of the measured sample to the surrounding radiation cannot be eliminated. Some samples with low emissivity cannot be measured, nor can the emissivity at different temperatures be measured. See domestic and foreign studies and literature reports that are the same as this method

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  • Method for testing coating infrared emittance with spectral reflectance method

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Embodiment Construction

[0008] Below in conjunction with accompanying drawing and embodiment the present invention is described further; Utilize the method for spectral reflectance method testing coating infrared emissivity, it is characterized in that: test system is made up of infrared light source, multifunctional infrared grating spectrum analyzer, computer; Wherein The infrared grating spectrometer analyzer is composed of a grating monochromator, a receiving unit, a scanning system, an electronic amplifier, an A / D acquisition unit, and a computer; the incident slit and the outgoing slit of the spectrometer are all value slits, and the width range is 0-2mm Continuously adjustable;

[0009] The specific steps of the detection are as follows: the light emitted by the infrared light source is divided into two paths after passing through the beam splitter, one path is used as the measurement beam; the other path is used as the reference beam; the known infrared reflectance ρ 0 The standard sample of ...

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Abstract

The invention relates to a method for testing coating infrared emittance with a spectral reflectance method, which is characterized in that light emitted by an infrared source is divided into two paths by a splitter, wherein one path serves as a measuring light beam, and the other path serves as a reference light beam; a standard sample with the known infrared reflectivity rho is placed in a test light path to store and record the measurement value rho' of a grating spectrum instrument; the sample to be tested, which is sprayed, is placed in the test light path; the plane of the sample to be tested and the incident light direction form an angle of 45 degrees, and the measurement value rho of the grating spectrum instrument is stored and recorded; a reflectivity spectrum is obtained by the grating spectrum instrument; and according to alpha=rho0/rho0', 1-rho*alpha is obtained by calculation and is the infrared reflectivity of the surface of the sample to be measured. The test device is simple, and the test condition is wide; errors brought by reflection on surrounding irradiation by a tested sample can be eliminated, the sample with low emissivity can be measured, and emissivity at different temperatures can be measured; and thus the method is a practical test method.

Description

technical field [0001] The invention relates to a method for testing the infrared emissivity of a coating by using the spectral reflectance method, in particular to a method for testing the infrared emissivity of a coating by a transmission spectrum method, evaluating the infrared performance of the coating, and then reflecting the infrared camouflage performance of the coating , belonging to the field of testing technology. Background technique [0002] According to different test principles, emissivity measurement methods are usually divided into calorimetry, reflectance method, radiant energy method and multi-wavelength measurement method; The standard sample needs to be heated, the test conditions are harsh, and the error caused by the reflection of the measured sample to the surrounding radiation cannot be eliminated. Some samples with low emissivity cannot be measured, nor can the emissivity at different temperatures be measured. See domestic and foreign research and ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25
Inventor 周胜蓝于清翠张苧心高成勇王纳新王希军廖大政
Owner FAW GROUP
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