Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Reflection type terahertz spectrum analysis method for eliminating phase error

A spectroscopic analysis and reflective technology, applied in the field of terahertz spectroscopic analysis, can solve problems such as large amount of calculation, measurement and calculation of experimental systems that are not suitable for atmospheric attenuation, and complex processing, so as to eliminate phase errors, overcome water vapor absorption, and calculate The effect of simple process

Inactive Publication Date: 2011-04-13
CAPITAL NORMAL UNIVERSITY
View PDF2 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these methods either require human intervention or require a large amount of calculation, which is very complicated to deal with.
And all are approximate calculations under ideal conditions without water vapor absorption, and are not suitable for measurement calculations of experimental systems with atmospheric attenuation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Reflection type terahertz spectrum analysis method for eliminating phase error
  • Reflection type terahertz spectrum analysis method for eliminating phase error
  • Reflection type terahertz spectrum analysis method for eliminating phase error

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] In order to better understand the shape, structure and characteristics of the present invention, preferred embodiments will be listed below and described in detail with reference to the accompanying drawings.

[0019] figure 1 Schematic diagram of a reflective terahertz spectroscopic analysis device for eliminating phase errors. The laser source used in this device is a titanium sapphire femtosecond laser manufactured by American Spectrophysics Corporation. The laser power is 0.90W, the pulse width is 100fs, and the repetition rate is 82MHz. Wavelength 800nm.

[0020] Such as figure 1 As shown, the femtosecond laser generated by the laser is split into two beams by a beam splitter 1: transmitted light and reflected light. A beam of transmitted light is stronger as the pump light I, which is incident on the terahertz emitter 3 after adjusting the optical path by the reflector, and the terahertz emitter 3 is a P-type InAs crystal. A chopper 2 is provided between the be...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a reflection type terahertz spectrum analysis method for eliminating a phase error, which comprises the following steps of: 1, measuring a terahertz time domain waveform of a reference signal when a sample to be tested is not placed; 2, measuring a terahertz time domain waveform of information when the sample to be tested is placed; 3, respectively obtaining angular frequencies corresponding to phase spectrums omega of the reference signal and the sample to be tested in a system effective frequency range according to the terahertz time domain waveforms; 4, deducting the phase spectrum of the sample to be tested by the phase spectrum of the reference signal to obtain a phase difference spectrum; and 5, deviating second derivative for the angular frequency corresponding to the phase difference spectrum to extract a terahertz characteristic absorption spectrum of the sample to be tested in the system effective frequency range.

Description

technical field [0001] The present invention relates to a reflective terahertz spectral analysis method, in particular to a reflective terahertz spectral measurement method for weakly polar organic compound materials, which can eliminate the phase error in the reflective spectral measuring device without human intervention and A Terahertz Spectroscopy Method for the Effect of Water Vapor Absorption. Background technique [0002] Reflective terahertz time-domain spectroscopy (THz-RTDS) has always been considered as a method closer to practical applications to detect the characteristics of target objects. Reflection measurement can provide distance information between the surface and interior of the sample, so the three-dimensional image of the object can be reconstructed; it is more conducive to the detection of large and thick objects that are opaque to terahertz radiation; and it is a method that can inspect and identify buried Methods of targeting objects in impenetrable ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/31
Inventor 张亮亮钟华邓朝张存林
Owner CAPITAL NORMAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products