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Residual filtering method aiming at projected fringe image

A fringe image and residual technology, applied in the field of computer vision, can solve problems such as many judgment conditions, difficulty in correct positioning of residuals, inability to completely preserve fringe boundaries, etc., to improve speed and accuracy, and eliminate limitations

Inactive Publication Date: 2010-06-09
SHENZHEN INST OF ADVANCED TECH
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Problems solved by technology

[0003] However, each of these processing methods has its limitations: the adaptive median filter method smoothes the phase value that is not polluted by noise while removing the residual, and for the package image with a high noise level, use The histogram is difficult to locate the residuals correctly; although the mean filter method can adaptively set the size of the filter window according to the direction of the stripes, this method cannot completely preserve the stripe boundaries; Nico fully considers the geometric structure of the residuals, and A complete filter is designed, but there are too many judgment conditions for filtering, which makes the method cumbersome and time-consuming

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  • Residual filtering method aiming at projected fringe image

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[0045] In the technical field of computer vision, the technical term residual has a well-known meaning, and for the completeness of this application document, it will be described in detail here. which is defined as Figure 4 As shown, after performing the calculation of formulas (1)-(3) on the adjacent closed-loop four neighborhoods in the wrapped phase map, if Δ(i, j)≠0 in formula (1), we define the point (i, j ), (i+1, j), (i+1, j+1) and (i, j+1) constitute a "residual". When Δ(i, j)=1, the closed-loop four-neighborhood is called “positive residual”; when Δ(i, j)=-1, the closed-loop four-neighborhood is called “negative residual”; when Δ(i, j )=0, the closed-loop four-neighborhood is not a residual, Figure 4 (b), (c) and (d) denote positive, negative and non-residuals, respectively. In addition, a plurality of residuals that are connected or adjacent constitute a "residual area". The invention analyzes the geometric characteristics of the residual caused by the noise. ...

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Abstract

The invention relates to the technical field of computer vision, in particular to a residual filtering method aiming at projected fringe image, which uses active fringe structure light to measure the three-dimensional information of an object and the like, adopts an unsupervised clustering method to be combined with single joint clustering algorithm for residual filtering, and further improves the speed, accuracy and reliability of a three-dimensional measuring system; based on automatic optical inspection technology, the method can be applied to multiple aspects, is used for defect inspection for the surfaces of objects such as a circuit printing plate and the like, and realizes multiple two-dimensional detection functions for components on the plate; furthermore, the method can be used for three-dimensional detection for the height and the volume of solder paste or other small components on a chip circuit board by parallel or non-parallel light path structure.

Description

technical field [0001] The invention relates to a residual filtering method for projected fringe images, which can be applied to various occasions where projected fringes are used to measure object shapes, and belongs to the technical field of computer vision. Background technique [0002] In the prior art, many imaging systems use interference fringe technology to measure objects in three dimensions, for example, phase measurement profilometry, interferometric synthetic aperture radar, nuclear magnetic resonance imaging, and the like. Phase measurement profilometry is the application background of the present invention, such as figure 1 Shown is a schematic diagram of the composition of the existing measurement system. The system includes: (1) LCD projector 1, which is used to project striped structured light onto the surface of an object; (2) CCD sensor 2, which is used to collect the object to be measured projected with striped structured light; (3) computer 3, which use...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 程俊姜军
Owner SHENZHEN INST OF ADVANCED TECH
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