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Construction method of B scanning image of ultrasonic scanning microscope

A technology of scanning images and ultrasonic scanning, which is applied in the analysis of solids using sonic/ultrasonic/infrasonic waves, which can solve the problems of inaccurate software trigger position, reduce the amount of collected data, and process a large amount of data. , Reduce the amount of collected data, the effect of clear images

Inactive Publication Date: 2010-04-07
THE 45TH RES INST OF CETC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for constructing a B-scan image of an ultrasonic scanning microscope, which solves the shortcomings of inaccurate software trigger positions in the prior art, and the constructed B-scan image can determine the number of interfaces, interface depth, and defects of the device. Depth and other features, with the advantages of accurate image location, high precision, and clear images
For example, recording the time of the negative peak value of the reflected echo on the front surface of the measured target can also solve the shortcomings of the prior art that require higher surface flatness and placement of the measured target; if the amount of collected data is reduced, it can also solve the existing problems. In the technology, the software processes a large amount of data, slow image construction, and low efficiency; thus ensuring the accuracy and speed of image construction

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  • Construction method of B scanning image of ultrasonic scanning microscope
  • Construction method of B scanning image of ultrasonic scanning microscope
  • Construction method of B scanning image of ultrasonic scanning microscope

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Embodiment Construction

[0018] Below in conjunction with accompanying drawing (see figure 1 , figure 2 , image 3 ) and a preferred embodiment to further describe the present invention in detail, but not as a limitation of the present invention.

[0019] figure 2 In , the B-scan data gate is represented by a line segment, and the length of the line segment determines the depth range and signal threshold of the B-scan.

[0020] First of all, it should be explained that before B-scan, C-scan must be performed to obtain C-scan image;

[0021] The implementation steps of the algorithm are as follows:

[0022] 1. Set the front surface data gate on the A-scan waveform to determine the detection area and signal threshold.

[0023] 2. Draw a horizontal line on the obtained C-scan image to select the B-scan position of interest.

[0024] 3. Set the number of B-scan vertically drawn image pixels, and set the sampling frequency according to this value.

[0025] 4. If figure 2 As shown, the B-scan dat...

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Abstract

The invention provides a construction method of a B scanning image of an ultrasonic scanning microscope, which relates to the technical field of ultrasonic scanning microscope equipment for processing the acquired data. The method comprises the following steps: a. determining a B scanning data gate; b. scanning and emitting ultrasonic waves; c. carrying out data processing on voltage of each point; and d. constructing the B scanning image. In the invention, a grating ruler is used for synchronous position triggering to generate the ultrasonic waves, thereby overcoming the defect that the software triggering position is inaccurate; the front surface following technique is used for overcoming the defect that the algorithm has higher requirements on the surface flatness and arrangement of a measured object; and a method which sets the sampling frequency of an acquisition card according to a B scanning longitudinally set pixel point value is used for reducing the acquired data quantity and overcoming the defects of large software processing data quantity, slow image construction speed, low efficiency and the like.

Description

technical field [0001] The invention relates to the technical field of data processing collected by ultrasonic scanning microscope equipment, in particular to a method for constructing a B-scan image. Background technique [0002] With the increasing production scale and variety of electronic products, the degree of circuit integration and production automation has also increased accordingly. At the same time, the quality requirements for devices have also become higher and higher. , non-destructive testing of packaged devices is an indispensable process. Ultrasonic scanning microscopes are more and more widely used to detect defects such as delaminations, voids, and cracks that are not sensitive to X-ray inspections. Ultrasonic scanning microscope is a grating movement through the cooperation of the scanning axis and the stepping axis of the motion actuator. While the scanning axis is moving, it emits ultrasonic waves and receives reflected echoes, converts the analog sign...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N29/06
Inventor 邱军姚立新邴守东许博魏鹏魏祥英孙彬
Owner THE 45TH RES INST OF CETC
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