Non-contact IC card radio frequency protocol and application testing method

Abstract

The invention discloses a non-contact IC card radio frequency protocol and an application testing method, comprising screening interoperability key parameter, constructing a testing system, calibrating the testing system and testing, wherein screening is carried out according to the influence of the parameters to the interoperability, and the key parameter influencing the interoperability of a non-contact IC card can be found out in the parameters, so that the testing method is the only way for solving the problem of interoperability; and the testing system comprises professional testing software, a transceiver specially used for testing, an ISO 10373-6 test suite, a power regulating suite, a monitoring and protocol analyzing device, an oscilloscope and a connecting line used for testing.The invention has the advantages that by adopting multi-loop synchronous verification technique, working mode which can be used for completing every test scene based on script and modular software layered design technology, the invention effectively ensures the stability of the testing system as well as the authenticity and the recurrence of the test result, leads the test content to be updated and the problem analysis to be simple and flexible, and guarantees the function of the testing software to be expandable and the maintenance to be convenient and easy.

Description

technical field [0001] The invention relates to a test method, in particular to a non-contact IC card radio frequency protocol and an application test method. Background technique [0002] In recent years, the interoperability of contactless IC cards in radio frequency protocols and applications has gradually attracted people's attention and attention. At present, the industry has basically reached a consensus: testing the key parameters that affect the interoperability of radio frequency protocols and applications of contactless IC cards is the basis for evaluating the interoperability of contactless IC card products and then solving interoperability problems fundamental way. However, since these tests involve analog and digital electronic technology, MCU and interface technology, serial communication technology, radio frequency communication technology, measurement technology, information coding and encryption technology, electromagnetic field and microwave technology, pr...

AI Technical Summary

Problems solved by technology

[0006] 2. It is inconvenient to analyze and troubleshoot problems

[0008] 3. It is inconvenient to update the test content

[0010] 4. Depends on the technical level of testers

[0011] Due to the lack of stable operation of the test system and the lack of test monitoring methods, the existing test methods have relatively high requirements for the technical level of testers.

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