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Combined type device and method for precisely and dynamically measuring spatial position and posture

A dynamic measurement and combined technology, applied in the direction of measuring device, line-of-sight measurement, measuring distance, etc., can solve the problems of dynamic measurement accuracy, large measurement time lag, time lag and low sampling rate, etc., to extend the continuous working time , the effect of high sampling rate

Inactive Publication Date: 2009-12-23
NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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Problems solved by technology

Although the total station measurement system has realized dynamic tracking measurement and intelligence, there are still problems such as time lag and low sampling rate (5Hz), especially the large measurement time lag, which has a great impact on the dynamic measurement accuracy

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  • Combined type device and method for precisely and dynamically measuring spatial position and posture
  • Combined type device and method for precisely and dynamically measuring spatial position and posture
  • Combined type device and method for precisely and dynamically measuring spatial position and posture

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Embodiment Construction

[0040] Various details involved in the technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be pointed out that the described embodiments are only intended to facilitate the understanding of the present invention, rather than limiting it in any way.

[0041]The present invention is proposed aiming at the precision measurement requirements of the feed support system in the world's largest 500-meter aperture spherical radio telescope (FAST) (working range 300 meters, sampling rate 10Hz, precision RMS 2mm). Based on the research of this key technology, various related measurement technologies have been studied in depth, and a combined precision dynamic measurement device and method for space pose is proposed, which can realize high-precision real-time measurement of large-scale and super-large-scale space pose .

[0042] FAST is the world's largest spherical radio telescope built using pits in the ...

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Abstract

The invention discloses a combined type device and a method for precisely and dynamically measuring spatial position and posture. The device comprises an inertia measuring unit and a total station measuring unit which are connected with a data acquisition and processing unit respectively; and the data acquisition and processing unit is connected with a computer. The inertia measuring unit measures the acceleration and the angular velocity of a target solid conjugant; a total station measures and calculates the position and the posture of the target solid conjugant; the acceleration, the angular velocity and the position and the posture are sent to the computer through the data acquisition and processing unit; according to data arrival time, measurement time delay and an inertia measurement solution principle of the total station, the computer adopts a time backtracking algorithm and KALMAN wave filtering, merges and processes two kinds of data, removes the measurement time delay of the total station and resolves out the optimally-estimated position and the posture of the target solid conjugant. The combined type device and the method improves the stability and the real-time position and posture measuring precision of the prior total station measuring system, enriches the measuring output information of the prior dynamic tracking measurement system and meets the real-time measuring requirement of high precision, high sampling rate and long-time operation of a large-scale device on large-dimension space.

Description

technical field [0001] The invention belongs to the technical field of large-scale (more than 300 meters) precision measurement, and relates to a precise dynamic measurement technology of space pose. Background technique [0002] Precision measurement technology and devices are one of the main supporting technologies for advanced manufacturing, reflecting the national industrial and technological level. The continuous development of the national economy and advanced manufacturing puts forward new requirements for precision measurement. Therefore, improving the level of precision measurement is of great significance to improving my country's advanced manufacturing capabilities and promoting the development of the national economy. For the high-precision, high-sampling rate, and long-running real-time measurement problems of large-scale (up to 300 meters) spaces, no technology has an absolute competitive advantage. At present, the optional technologies mainly include: Global ...

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Application Information

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IPC IPC(8): G01C21/16G01C21/18G01C1/00G01C3/00
Inventor 朱丽春南仁东王启明蒋志乾胡金文翟学兵张志伟
Owner NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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