Surface roughness on line measurement method under uncertain condition
A surface roughness and measurement method technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of deviation and change of measurement results
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[0046] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0047] (1) Determine the modeling under light:
[0048] A. Take the first workpiece with a surface roughness value of 0.12 μm and place it on the production site; adjust the on-site LED light source so that the ambient light brightness value is 230Lux at this time, use a CCD camera to obtain an image of the workpiece surface, and convert the acquired image to grayscale image;
[0049] B. According to the grayscale image obtained in step A, extract the grayscale mean μ of the sampling area G As the first feature quantity T of the first workpiece surface image G1 ,Calculated as follows:
[0050] T G 1 = μ G = ( Σ i = 1...
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