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Storage device test method

A technology of storage device and test method, applied in static memory, instrument, etc.

Inactive Publication Date: 2010-12-15
INVENTEC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004]However, the problems faced by the above-mentioned hard disk test include: the test engineer needs to input test data and comparison data many times
Generally speaking, it takes about 18 minutes to test a hard disk, which is a waste of time and error-prone; Testing multiple hard drives will waste a lot of time; all test results are manually recorded, which is not conducive to the management of test results
Therefore, the current hard disk performance testing method really increases the testing cost of hard disk manufacturers.

Method used

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Embodiment Construction

[0014] See figure 1 It is used to display the operating process diagram of the test method of the storage device of the present invention.As shown in the figure, the test method of the storage device of the present invention is applied to a computer system with input device and display device (not a map here) to automatically test the execution efficiency of the storage device connected to the computer system.

[0015] First execute step S10, establish several storage device types and storage device efficiency as a database that is connected to the computer system in advance. The database can be built in the computer system or a server connected to the computer system network.Or in another computer system, the storage device type and storage device efficiency expectations in the database are corresponding.In this embodiment, several storage device types are different hard disks types, including SAS, SATA, SCSI, FC, IDE and other types of hard disks. The efficiency of the storage d...

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Abstract

The invention relates to a testing method of a storage device, wherein a plurality of storage device types and relative efficiency expected value of the storage device are prestored, then storage device types await to be tested and testing times are received and input, efficiency testing which accords with the testing times is executed to the storage device, then an average value of efficiency testing results is obtained through operation according to all efficiency testing results, furthermore, corresponding storage device efficiency expected value which is obtained from a database is compared with the average value according to the storage device types await to be tested, a comparison result is output, at last, all efficiency expected values and comparison results are respectively stored.

Description

Technical field [0001] The present invention involves a test method for storage device. Specifically, it is a test method for a storage device that completes the effectiveness test of the computer system to the storage device with the electrical connection with the computer system. Background technique [0002] With the rapid development of computer technology, computer operating system functions are becoming more and more powerful, and more and more applications are used, and the hard disk storage of the operating system and these applications play an important role.Once the hard disk execution is unstable or the load is too heavy, the efficiency of the entire system will decrease significantly.Therefore, system manufacturers or server managers pay special attention to the stability of the hard disk operation. Because its stability is of great relationship with the effectiveness of the entire operating system, it is necessary to make meticulous testing before the server or hard ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/00
Inventor 罗梓桂陈志丰
Owner INVENTEC CORP
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