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Method for correct measurement for wave-guide wide edge gap admittance of millimeter wave frequency range

A technology for measuring waves and broadsides, applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of phase error, affecting the accuracy of measurement results, etc., to reduce phase error, easy to operate, The effect of high test accuracy

Inactive Publication Date: 2009-01-07
10TH RES INST OF CETC
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AI Technical Summary

Problems solved by technology

Because the movement of the test cable caused by the assembly and disassembly of the calibration part and the test part during the test, there may be a phase error of a few tenths of a degree, which may exceed 1° in severe cases, thus affecting the accuracy of the gap admittance measurement results

Method used

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  • Method for correct measurement for wave-guide wide edge gap admittance of millimeter wave frequency range
  • Method for correct measurement for wave-guide wide edge gap admittance of millimeter wave frequency range

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Embodiment Construction

[0013] see figure 1 , figure 2 . According to the present invention, use vector network analyzer to electrically connect the computer that contains mathematical analysis software program, set up test platform; coaxial-to-waveguide converter. One end of transmission line L1 is used as standard 1, the other section of transmission line L2 is used as standard 2, and the reflector is used as standard 3 to form two transmission standards and one reflection standard (transmission line L1-reflector R-transmission line L2) LRL calibration form.

[0014] When calibrating the vector network analyzer, connect the two test cables of the vector network analyzer to both ends of a waveguide used as a transmission standard. The length of the waveguide is the same as the length of the tested admittance test piece, and the S-parameters of the tested transmission waveguide are measured. Connect a test cable of the vector network analyzer to a short-circuited waveguide used as a reflection s...

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Abstract

The invention relates to a method used for accurately measuring the wave guide wide margin gaping admittance by millimeter wave and wave band wave. In the testing process, a test platform consisting of a vector network analyzer and a computer is equipped, and the test paltform is connected with two transmission line calibration elements L1 / L2 of two ports of vector network analyzer and a reflection calibration element R, wherein, the length of L1 and R is identical with that of the measured element, while the length of L2 differs by lambda / 4 as the measured element. The LRL standard calibration test is performed on dual ports of the vector network analyzer. The S parameter of the measured calibration element is measured and 12 items of measuring errors existing in the testing process are figured out. Then the S parameter of the test sample is tested. An admittance value of the wave guide wide margin is figured out through the mathematical software in the computer. In the invention, the dual ports of the vector network analyzer are calibrated through LRL calibration. By adjusting the length of the calibration element, the problems are solved that the phase error and the complexity of the processed and test attachments caused by the movement of the test cable in the calibration process of the prior art where frequent assembly and disassembly of the calibration element and the measured element are conducted.

Description

technical field [0001] The invention relates to a method for measuring waveguide slot admittance, in particular to a method for accurately measuring waveguide broadside slot admittance in the millimeter wave frequency band. Background technique [0002] Existing waveguide admittance testing methods include traveling wave power method, simple slot admittance measurement method, slot array admittance rapid measurement method, single slot measurement method and multi-slot self-admittance measurement method. Commonly used are single-slit measurement method and multi-slit measurement method. No matter which measurement method is used, S-parameters must be accurately measured in actual measurement. Therefore, strict two-port calibration must be performed on the two test ports of the vector network analyzer. . At present, commonly used calibration methods mainly include SLOT calibration and TRL calibration. SLOT calibration needs precise calibration parts to determine the 12 meas...

Claims

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Application Information

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IPC IPC(8): G01R27/02
Inventor 罗凡
Owner 10TH RES INST OF CETC
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