Multilayered medium material multi-parameter measurement method and system
A technology of multi-layer medium and measurement method, applied in measurement devices, phase influence characteristic measurement, instruments, etc., can solve problems such as unsolvable and low efficiency, and achieve the effect of optical filter optimization
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment approach 1
[0022] image 3 Shown is the implementation of the measurement of the properties of the laser surface plasmon thin film: the experimental measurement system diagram composed of the electromagnetic wave transmitting and receiving subsystem, and the rotating table subsystem. like Figure 4 and Figure 5 Shown, the multilayer dielectric film is made up of K9 glass layers 14 and 18, silver film 15, silicon dioxide film 16 and air layer 17 successively in this embodiment, and the main purpose of this embodiment is to measure the refractive index of all media, and Thickness of silver film and silicon dioxide film. The specific process is as follows: the narrow linewidth laser beam emitted by the laser 4 is modulated by the modulator 5, then polarized by the polarizer 6, and focused by the lens 7 before entering the rotary table subsystem 8, and the focus is located at the center of the multilayer film to be tested position; the laser beam is reflected on the surface of the multil...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com