Device and method for generating probe tester map data
A map data and testing machine technology, which is applied to measurement devices, optical devices, electronic circuit testing, etc., can solve the problems of reducing the accuracy of calibrated map data, time-consuming and reliance on map data, etc., and achieve the effect of improving detection efficiency.
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[0030] The invention will be described in more detail hereinafter with reference to the accompanying drawings showing embodiments of the invention. However, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are presented so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. In these drawings, the size and relative sizes of layers or regions may be exaggerated for clarity.
[0031] It will be understood that when an element or layer is referred to as being "on," "connected to," or "coupled to" another element or layer, it can be directly on, connected to, or "coupled to" another element or layer. Other elements or layers are directly connected or coupled, or there are intervening elements or layers. In contrast, when an element is referred to as being "directly on," "directly connected to" or ...
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