Multilayer wiring substrate having a castellation structure

Abstract

A multilayer wiring substrate has a through hole that passes from a first surface through to a second surface. The multilayer wiring substrate includes an electrical connection terminal formed in at least one of an inner edge portion which is a periphery of the through hole, an outer edge portion which is an outer periphery of the substrate, and a non-edge portion, on at least one of the first surface and the second surface. The electrical connection terminal has a castellation structure that does not pass through to a surface opposite to a formation surface.

Description

BACKGROUND OF THE INVENTION[0001]1. Field of the Invention[0002]The present invention relates to a multilayer wiring substrate, a stack structure sensor package, and a method of manufacturing the stack structure sensor package that are applied to an image sensor and the like.[0003]2. Description of the Related Art[0004]Japanese Unexamined Patent Application Publication No. 2002-353427 proposes a stack structure sensor package of an image sensor.[0005]FIG. 1 illustrates the stack structure sensor package of the image sensor as disclosed in Japanese Unexamined Patent Application Publication No. 2002-353427.[0006]In a sensor package structure in FIG. 1, a frame-shaped second substrate 2 is joined onto a first surface of a first substrate 1, thereby forming a cavity 3.[0007]An integrated circuit 4 is mounted on the first surface of the first substrate 1 in the cavity 3, and an image sensor chip 5 is joined onto the second substrate 2. Thus, the stack structure sensor package is formed.S...

AI Technical Summary

Benefits of technology

[0008]However, the above-mentioned structure is limited to a stack-up manufacturing process in which the integrated circuit 4 is joined after the cavity 3 is formed by the first substrate 1 and the second substrate 2. This has the following disadvantages.

[0013]It is desirable to provide a multilayer wiring substrate, a stack structure sensor package, and a method of manufacturing the stack structure sensor package that enable a sensor component to be reused even when a failure occurs during manufacture, improve connection strength of the sensor component, and make the structure small and thin.

[0017]According to the embodiments of the present invention, it is possible to reuse a sensor component even when a failure occurs during manufacture of a sensor package having a stack structure, to improve connection strength of the sensor component, and to make the structure small and thin.

Problems solved by technology

However, the above-mentioned structure is limited to a stack-up manufacturing process in which the integrated circuit 4 is joined after the cavity 3 is formed by the first substrate 1 and the second substrate 2.

Since the stack-up in the same process step is necessary, a manufacturing location is limited.

Besides, occurrence of a failure causes a high disposal cost.

However, there may be a problem with connection strength because a joint area is limited to the bottom surface.