Memory comprising diode

Abstract

A memory operable at a high speed is obtained. This memory comprises a plurality of word lines, first transistors each connected to each the plurality of word lines for entering an ON-state through selection of the corresponding word line, a plurality of memory cells including diodes having cathodes connected to the source or drain regions of the first transistors respectively and a data determination portion connected to the drain or source regions of the first transistors for determining data read from a selected memory cell.

Description

BACKGROUND OF THE INVENTION[0001]1. Field of the Invention[0002]The present invention relates to a memory, and more particularly, it relates to a memory comprising memory cells including diodes.[0003]2. Description of the Background Art[0004]Japanese Patent Laying-Open No. 2005-268370 discloses a crosspoint mask ROM (hereinafter referred to as a crosspoint diode ROM) having a plurality of memory cells, each including a diode, arranged in the form of a matrix. This crosspoint diode ROM is generally known as an exemplary memory.[0005]FIG. 11 is a circuit diagram showing the structure of the conventional crosspoint diode ROM disclosed in the aforementioned Japanese Patent Laying-Open No. 2005-268370. Referring to FIG. 11, a plurality of word lines WL and a plurality of bit lines BL are arranged in a memory cell array 101 to intersect with each other in the conventional crosspoint diode ROM. The word lines WL and the bit lines BL are connected to a row decoder 106 and a column decoder 1...

AI Technical Summary

Benefits of technology

[0015]As hereinabove described, the cathodes of the diodes included in the memory cells are connected to the source or drain regions of the first transistors each connected to each of the plurality of word lines to enter an ON-state through selection of the corresponding word line and the data determination portion is connected to the drain or source regions of the first transistors for determining the data tread from the selected memory cell, whereby the memory according to the aspect of the present invention can determine data on the basis of the potentials of the drain or source regions of the first transistors without connecting the bit lines to the data determination portion in data reading. Thus, the bit lines may not be brought into floating states in data reading dissimilarly to a case of connecting the data determination portion to the bit lines, whereby the memory can fix a selected bit line to a first potential (high level, for example) while fixing a nonselected bit line to a second potential (low level, for example). Thus, the memory, capable of fixing the potential of the nonselected bit line in data reading, can prevent the nonselected bit line from potential fluctuation. Therefore, the memory can prevent the diode included in a nonselected memory cell from potential fluctuation resulting from potential fluctuation of the nonselected bit line. In data reading, therefore, the memory can inhibit the selected bit line from potential fluctuation resulting from potential fluctuation of the cathode of the diode included in the nonselected memory cell. Consequently, the memory, requiring no standby time for returning the potential of the selected bit line to the original level, can operate at a high speed.

Problems solved by technology

Thus, it is disadvantageously difficult to operate the diode ROM at a high speed.

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