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Fault diagnostic system and method for under industrial producing process small sample condition

A fault diagnosis system and industrial production technology, applied in general control systems, control/regulation systems, program control, etc., can solve problems such as inability to effectively handle small samples and difficulty in obtaining diagnostic results

Inactive Publication Date: 2007-06-27
ZHEJIANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to overcome the shortcomings of existing industrial process fault diagnosis devices that cannot effectively deal with small samples, non-linearity, and measured data that require strong model generalization capabilities, and that it is difficult to obtain better diagnostic results, the present invention provides a device that can handle better Fault diagnosis system and method under the conditions of small samples in industrial production processes that deal with small samples, non-linearity and measured data requiring strong model generalization ability, and can obtain good diagnostic results

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  • Fault diagnostic system and method for under industrial producing process small sample condition
  • Fault diagnostic system and method for under industrial producing process small sample condition

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Embodiment 1

[0059] With reference to Fig. 1, Fig. 2, Fig. 3, a kind of fault diagnosis system under the small sample condition of industrial production process, comprises the scene intelligent instrument 2 that is connected with industrial production process object 1, DCS system and upper computer 6, described DCS system It consists of a data interface 3, a control station 4, and a database 5; an intelligent instrument 2, a DCS system, and a host computer 6 are sequentially connected through a field bus, and the host computer 6 includes:

[0060] The standardization processing module 7 is used to standardize the data. The mean value of each variable is 0 and the variance is 1 to obtain the input matrix X. The following process is used to complete:

[0061] 1) Calculate the mean: TX ‾ = 1 N Σ i = 1 N TX ...

Embodiment 2

[0120] With reference to Fig. 1, Fig. 2, Fig. 3, a kind of fault diagnosis method under the small sample condition of industrial production process, described fault diagnosis method comprises the following steps:

[0121] (1), determine the used key variable of fault diagnosis, collect the data of described variable when system is normal and fault respectively from the history database of DCS database as training sample TX;

[0122] (2), in principal component analysis module 9 and support vector machine classifier module 11, set parameters such as principal component analysis variance extraction rate, support vector machine kernel parameter and confidence probability respectively, set the sampling cycle in DCS;

[0123] (3), the training sample TX is in the upper computer 6, and the data is standardized, so that the mean value of each variable is 0, and the variance is 1, and the input matrix X is obtained, and the following process is used to complete:

[0124] 3.1) Calculat...

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Abstract

The fault diagnosis system includes on site intelligent instrument connected to objects of industrial process, DCS system, and upper device. The DCS system is composed of data interface, control station, and database. The intelligent instrument is connected to DCS system, and upper device. The upper device includes the standardization process module, functional module of pivot element analysis, functional module for supporting classifier of vector machine, failure predication module, signal acquisition module, module for determining data to be diagnosed, and fault diagnosis module. The invention also discloses a fault diagnosis method. The invention discloses fault diagnosis system and method capable of well treating measured non-linear data obtained from small sample with high capability of generalizing model, as well as capable of obtaining good diagnosis result under condition of small sample in industrial process.

Description

(1) Technical field [0001] The invention relates to the field of industrial process fault diagnosis, in particular to a fault diagnosis system and method under the condition of a small sample of industrial production process. (2) Background technology [0002] Due to the requirements of product quality, economic benefits, safety and environmental protection, industrial processes and related control systems have become very complex. In order to ensure the normal operation of industrial systems, fault diagnosis and detection play a very important role in industrial processes. In recent years, the application of statistical analysis to process monitoring and fault diagnosis has been extensively studied. [0003] Using industrial measured data, using statistical methods for fault diagnosis, avoiding complicated mechanism analysis, and solving is relatively simple and fast. However, most of the current industrial process fault diagnosis devices are based on asymptotic statistica...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/048G05B19/418G05B13/02G06F17/00
CPCY02P90/02
Inventor 刘兴高
Owner ZHEJIANG UNIV
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