Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Datalog support in a modular test system

A data log and test system technology, applied in digital circuit testing, electronic circuit testing, etc.

Inactive Publication Date: 2007-06-13
ADVANTEST CORP
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] One of the problems with specialized tester architectures is that all hardware and software remain in a fixed configuration for a given tester

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Datalog support in a modular test system
  • Datalog support in a modular test system
  • Datalog support in a modular test system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] The present invention provides a method and system for data log support in a modular test system. The following description is intended to enable any person skilled in the art to make and use the invention. Descriptions of specific techniques and applications are by way of example only. Various modifications to the examples described herein will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other examples and applications without departing from the spirit and scope of the invention. Thus, the present invention is not intended to be limited to the examples described and shown, but is to be accorded the widest scope consistent with the principles and features disclosed herein.

[0024] Fig. 1 shows an open architecture testing system according to one embodiment of the present invention. A system controller (SysC) 102 is coupled to a plurality of site controllers (SiteCs) 104 . A system controller can also b...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for communicating test information from a source to a destination is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, the at least one site controller for controlling at least one test module. The method further includes providing a datalog framework for supporting extension of user-defined datalog formats, providing support classes for supporting user-initiated datalog events, receiving a datalog event requesting for communicating input test information from the source to the destination, configuring output test information based upon the destination, the datalog framework and the support classes,and transferring the output test information to the destination.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of provisional application no. 60 / 573,577 "Software Development in an Open Architecture Test System," filed May 22, 2004, by Advantest Corporation, the entire contents of which are hereby incorporated by reference. technical field [0003] The present invention relates to the field of automated test equipment (ATE). More specifically, the present invention relates to a method and system for supporting data logging in an open architecture test system. Background technique [0004] The increasing complexity of system-on-chip (SOC) devices and the simultaneous need to reduce the cost of testing chips has forced integrated circuit (IC) manufacturers and tester vendors to rethink how IC testing should be performed. Industry studies have shown that without re-engineering, the projected cost of testers will continue to increase significantly in the near future. [0005] A major reason for...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/319
Inventor 马克·埃尔斯顿安康·普拉马尼克
Owner ADVANTEST CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com