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Diffraction spectrum detecting system

A measurement system and diffraction spectrum technology, applied in the use of diffractive elements to generate spectrum, spectrum investigation, spectrum generation, etc., can solve the problems of difficulty in adjusting the measurement state, time-consuming and laborious, etc.

Inactive Publication Date: 2007-04-11
李捷
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Using a spectrometer to measure the diffraction spectrum of a grating is a spectral measurement method with a simple principle and a clear structure. However, during the measurement process, both the collimator and the telescope are required to be perpendicular to the grating surface, and the method of half adjustment is required. The operation process is time-consuming and laborious. It is difficult to adjust to an accurate measurement state. The invention patent "vertical plane mirror and its application", the patent number is 92105476.9, the invention patent "back-coated reflection grating" patent number is 96102159.4, and the invention patent "the application of grating plane mirror diffraction spectrum measurement system" will It is used in the experimental teaching of grating diffraction spectroscopy and has achieved good results. However, in the actual operation process, some inconvenient places still need to be improved

Method used

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Experimental program
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Embodiment approach 1

[0010] Embodiment 1: Two movable and foldable bases form a 120° horizontal support in a movable manner, the thickness of the groove is 2mm, the thickness of the double-sided reflective plane mirror B and the back coated reflective grating C are both 2mm and The thickness is the same; the two sides of the double-sided reflective plane mirror B are coated with semi-reflective film, and the back is coated with reflective grating C. It is composed of two surfaces, the grating stripe surface I and the semi-reflective surface II. There are 100 / mm transmission grating stripes, semi-reflective surface II is coated with semi-reflective light analysis film, and the light analysis film is vacuum-coated with magnesium fluoride. The ratio of the transmitted light intensity to the reflected light intensity of the semi-reflective surface II is 50:50.

[0011] The specific operation steps used are: (1) Place the two bases of the movable foldable horizontal bracket A at 120° in a movable manne...

Embodiment approach 2

[0012] Embodiment 2: Two movable and foldable bases form a 130° horizontal support A in a movable manner, and other specific operation steps are the same as Embodiment 1.

Embodiment approach 3

[0013] Embodiment 3: Two movable and foldable bases form a 140° horizontal support A in a movable manner, and other specific operation steps are the same as Embodiment 1.

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Abstract

The diffraction spectrum measuring system belongs to the fields of optical measurement, optical instrument, teaching apparatus and other technology. It consists of one movable foldable horizontal stand and two pedestals with the same horizontal base plane; and features the two pedestals set to form one obtuse angle, the double sided reflecting plane mirror with half-reflecting films coated to its two planes, and the reflecting grating comprising one grating stripe plane and one semi-reflecting plane. The diffraction spectrum measuring system is used in spectrometer for diffraction spectrum measurement to replace the plane mirror for optical path regulation and the grating for spectrum measurement, and has the simplified diffraction spectrum measuring process and raised measurement precision.

Description

technical field [0001] The invention relates to a diffraction spectrum measurement system, which belongs to the technical fields of optical measurement, optical instruments, teaching instruments and equipment, and is specifically a diffraction spectrum measurement instrument. technical background [0002] Using a spectrometer to measure the diffraction spectrum of a grating is a spectral measurement method with a simple principle and a clear structure. However, during the measurement process, both the collimator and the telescope are required to be perpendicular to the grating surface, and the method of half adjustment is required. The operation process is time-consuming and laborious. It is difficult to adjust to an accurate measurement state. The invention patent "vertical plane mirror and its application", the patent number is 92105476.9, the invention patent "back-coated reflection grating" patent number is 96102159.4, and the invention patent "the application of grating ...

Claims

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Application Information

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IPC IPC(8): G01J3/18G01J3/28
Inventor 李捷
Owner 李捷
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