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Method of realizing single board station testing and its system

A test method and single-board technology, applied in the direction of digital circuit test, electronic circuit test, measurement of electricity, etc., can solve the problems of limited storage space, inflexible and intuitive station test, etc., to achieve content reduction, flexible station test method, The content is fully effective

Inactive Publication Date: 2006-01-25
ZTE CORP
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AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a method and system for realizing single-board station testing, in order to overcome the shortcomings of the limited storage space of single-chip microcomputers in the prior art and the inflexibility and intuition of station testing. Therefore, a front-end and back-end The method of testing the single board station in an interactive way will save the space occupied by a lot of print statements, and transfer a lot of explanatory and suggestive language to the background for processing and display; at the same time, the background can also be processed and displayed according to the Design different test methods for different test items to enhance the flexibility, speed and efficiency of site testing

Method used

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  • Method of realizing single board station testing and its system
  • Method of realizing single board station testing and its system

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Embodiment Construction

[0024] The implementation method will be described in detail below in conjunction with the accompanying drawings.

[0025] The system includes a foreground single board, a background system and other test instruments, and the foreground single board and the background system are connected through a communication port, such as a serial port or a network port.

[0026] The foreground veneer is the veneer to be tested, and the station test of the foreground veneer is directly performed and the result is reported to the background system.

[0027] The background system is located on a general-purpose computer, triggers various test items by clicking, and sends test messages to the foreground single board, and at the same time analyzes and displays the test results according to the received foreground messages. The system of the present invention can select multiple times. , repeat the test, and can also test a single test item and test multiple test items at the same time.

[002...

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Abstract

The invention is a method and system for realizing mono-chip working position testing, and the method includes the steps: starting up a testing background system and selecting the required testing items; communicating a foreground mono-chip with the background system, where the foreground mono-chip is normally power-on and enters in a testing mode; the background system starts up testing and sends the information corresponding to the testing items to the foreground mono-chip in turn; the foreground mono-chip receives the information to resolve it and makes a testing processing flow on it and after primary testing is completed, returns tested result in a fixed information returning form to the background system; the background system receives the tested result and then makes the corresponding resolution according to different testing items and displays the tested result in the interface of the background system. The invention raises the speed of a MCU processing other functions.

Description

technical field [0001] The present invention relates to a method and system for station testing of a hardware single board in the field of automatic testing, in particular to a method for performing various hardware device, performance and function tests on a single board controlled by a single-chip microcomputer at a station, as well as repeated multiple combination tests methods and systems. Background technique [0002] The site test of the board is a test process that must be completed before the board leaves the factory. Its purpose is to ensure the reliability and stability of the board, including three aspects: device test, function test and simple performance test. Device testing mainly refers to testing the device paths on the board; functional testing is testing whether the board can realize its specific functions; simple performance testing refers to testing the basic performance indicators. The currently commonly used single-board station test method is to add t...

Claims

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Application Information

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IPC IPC(8): G01R31/317G01R31/3181
Inventor 谢志雄崔卓
Owner ZTE CORP
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