Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Superquick pulse x-ray phase contrast imaging device

A phase-contrast imaging and ultra-fast pulse technology, which is applied in measuring devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems that limit the development of X-ray phase contrast imaging technology, and achieve the effect of excellent spatial equality

Inactive Publication Date: 2005-01-05
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF0 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Unfortunately, the X-ray sources used in X-ray phase contrast imaging are limited to synchrotron radiation sources and X-ray tubes. Therefore, the exposure time is as long as several seconds or even tens of minutes, and the research objects are all static samples. Limits the further development of X-ray phase contrast imaging technology

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Superquick pulse x-ray phase contrast imaging device
  • Superquick pulse x-ray phase contrast imaging device
  • Superquick pulse x-ray phase contrast imaging device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] Ultrafast pulse X-ray phase contrast imaging device of the present invention such as figure 1 shown. It includes a femtosecond laser system 1, a beam splitter 2, an optical delay line composed of total reflection mirrors 3, 4, 5, a total reflection mirror 6 and a target chamber 12, which is equipped with a Chromatic aberration lens 8 , a sample chamber 9 , a solid target 7 and a concave mirror 10 , and a detector 11 outside the target chamber 12 . The positional relationship of the above components is as follows: a beam splitter 2 is placed on the laser output optical path of the femtosecond Ti:sapphire laser system 1, and the laser output from the femtosecond Ti:sapphire laser system 1 outputs two beams A and B through the beam splitter 2. The light beam A enters the target chamber 12 through the optical delay line, is converged by an achromatic lens 8 and enters the sample chamber 9 and interacts with the gas therein to generate a plasma to be studied. Such beams ar...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Pulse widthaaaaaaaaaa
Login to View More

Abstract

The invention is a ultra-fast pulse X ray phase contrast imaging device, it includes a femtosecond laser system, splitter, optical delaying line, all-mirror and target chamber, in which there arranges a achromatic lens, sample chamber, fixed target and concave reflecting mirror, there has a detector out of the target chamber. The position relation of above mentioned elements is: a splitter is arranged on the output light path of femtosecond titanium stone laser system, the splitter divides the laser bema into A, and B, the A beam enters the target chamber through optical delay, and it is gathered to radiate the gas in the sample chamber with achromatic lends, the B enters the target chamber through all-mirror, reflected by the reflecting mirror and gathered onto the target, generates a X ray, the X ray enters the sample chamber, the state of the plasma in the sample chamber is recorded by the detector, the distance between the detector and the gas chamber agrees the imaging condition.

Description

Technical field: [0001] The invention relates to an X-ray phase contrast imaging device, in particular to an ultrafast X-ray phase contrast imaging device. This imaging device has important application prospects in the study of the formation process of ultrashort pulse self-focusing filaments and the formation of ultrafast plasma. Background technique: [0002] In recent years, X-ray phase-contrast imaging technology has achieved rapid development. The biggest feature of this imaging technology is that it can obtain phase information without using interference method. It is also different from traditional Zernike phase-contrast interference microscopes, which do not require any optical components to change the phase of X-rays to obtain phase information. [0003] When partially coherent X-rays pass through an object, in addition to absorption, a phase change occurs, that is, a distortion of the wavefront occurs. This wavefront distortion causes the propagation direction of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N23/00G03B42/02
Inventor 陈建文高鸿奕向世清李儒新徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com