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Electronic component near-field scanning electromagnetic pattern clustering analysis method and system

A technology of electronic components and near-field scanning, which is applied in the direction of instruments, computer components, character and pattern recognition, etc., can solve the problems of time-consuming, result error, insufficient artificial intelligence, etc.

Pending Publication Date: 2022-08-05
SOUTH CHINA NORMAL UNIVERSITY
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Problems solved by technology

[0005] In the prior art, there are relatively few applications of clustering for electromagnetic radiation assessment. Using the K-Means algorithm for electromagnetic pattern clustering can achieve certain results, but the use of the K-Means algorithm also has limitations and requires manual presets. Set the K value of the initial cluster number, which not only takes time, is not enough artificial intelligence, but also brings in subjective judgments to cause errors in the results

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  • Electronic component near-field scanning electromagnetic pattern clustering analysis method and system
  • Electronic component near-field scanning electromagnetic pattern clustering analysis method and system
  • Electronic component near-field scanning electromagnetic pattern clustering analysis method and system

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Embodiment 1

[0074] The method and system of the present invention are applied to chip products, combined with figure 1 shown, follow the steps below:

[0075] Step 1: Before the test, ensure that the chip to be tested can work normally and the surface of the chip to be tested is sufficiently flat;

[0076] Step 2: Place the chip to be tested horizontally on the test bench and power on normally;

[0077] The third step: control the movement of the electromagnetic probe through the computer, adjust the distance d from the sensing part of the electromagnetic probe to the surface of the chip to be tested, d is controlled at several hundred microns, and set the scanning step size of the electromagnetic probe in the X-Y direction of the scanning plane;

[0078] Step 4: Set the parameters of the spectrum analyzer;

[0079] Step 5: The electromagnetic probe starts serpentine scanning from the upper left corner of the chip to be tested until the scanning ends;

[0080] Step 6: Export the scanne...

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Abstract

The invention relates to a near-field scanning electromagnetic pattern clustering analysis method for an electronic component, and the method comprises the steps: carrying out the near-field scanning of a tested device, carrying out the post-processing of the data obtained through scanning, obtaining an electromagnetic image, and carrying out the clustering analysis of the obtained electromagnetic pattern through an improved K-Means clustering method. According to the improved K-Means clustering method, firstly, a K value is determined through an elbow method, and then clustering analysis is carried out on the obtained electromagnetic pattern through the K-Means clustering method. The invention further relates to an electronic component near-field scanning system for implementing the method. According to the method, the improved K-Means algorithm is adopted, an initial clustering value K does not need to be set in advance, and electromagnetic pattern clustering can be carried out more intelligently.

Description

technical field [0001] The invention relates to electromagnetic pattern clustering, in particular to a near-field scanning system for electronic components and a method for analyzing electromagnetic pattern clustering after scanning. Background technique [0002] At the current level of integration technology and semiconductor technology, chips / circuits have a high degree of integration and a large scale. The electromagnetic reliability problems of products become more and more, and it is very necessary to evaluate the electromagnetic radiation of products. Due to the large workload of manual investigation, there are certain difficulties. [0003] In recent years, near-field scanning has been widely used to measure IC electromagnetic radiation, high-resolution probes to observe magnetic domains of magnetic materials, etc., and play an important role in electromagnetic interference diagnosis, and the electromagnetic pattern of near-field scanning can intuitively reflect EMC....

Claims

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Application Information

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IPC IPC(8): G06K9/62G06K9/00
CPCG06F2218/08G06F18/23213G06F18/22
Inventor 伍雨欣许坤远方文啸黄权
Owner SOUTH CHINA NORMAL UNIVERSITY
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