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Reliability evaluation method considering influence of multi-stress coupling effect on product degradation

A multi-stress and reliability technology, applied in the direction of design optimization/simulation, instruments, complex mathematical operations, etc., can solve the problems of inaccurate reliability evaluation results, and the joint influence of degradation rate-degradation fluctuations due to multi-stress coupling effects, etc. , to achieve the effect of enhancing flexibility and applicability and improving evaluation accuracy

Active Publication Date: 2022-07-29
HARBIN INST OF TECH
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Problems solved by technology

[0004] In order to solve the problem that the existing product reliability evaluation method has not considered the multi-stress coupling effect and its joint influence on the product degradation rate-degradation fluctuation, which leads to inaccurate reliability evaluation results, the present invention provides a multi-stress Reliability Evaluation Method of Coupling Effect on Product Degradation

Method used

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  • Reliability evaluation method considering influence of multi-stress coupling effect on product degradation

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Embodiment

[0061] The embodiment takes the multi-stress accelerated degradation test data of a certain type of film capacitor as an example to complete the reliability evaluation considering the combined effect of multi-stress coupling on the degradation rate and degradation fluctuation of the film capacitor. The specific steps are as follows:

[0062] Step 1: Determine the amount and type of accelerated stress applied in the multi-stress accelerated degradation test of a certain type of film capacitor S = {S 1 ,S 2 ,S 3 }, S 1 represents the temperature stress, S 2 represents the voltage stress, S 3 represents the vibration stress.

[0063] Step 2: Establish a performance parameter degradation model considering the film capacitor degradation rate-degradation fluctuation correlation, as shown in formula (1).

[0064] Step 3: Establish the quantitative relationship of the effect of temperature, voltage and vibration stress coupling on the degradation rate of the film capacitor, as sh...

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Abstract

The invention discloses a reliability evaluation method considering influence of a multi-stress coupling effect on product degradation. The method comprises the following steps: 1, establishing a performance parameter degradation model considering product degradation rate-degradation fluctuation correlation; 2, establishing a quantitative influence relationship of a multi-stress coupling effect on a product degradation rate; 3, establishing an accelerated degradation model considering the combined influence of the multi-stress coupling effect on the product degradation rate-degradation fluctuation; 4, deducing a failure distribution function and a reliability function of the product under the multi-stress coupling effect; 5, realizing self-adaptive identification and unknown parameter estimation of the coupling function by using maximum likelihood estimation; and 6, substituting the optimal coupling function obtained by optimization and the unknown parameter estimation value into the failure distribution function and the reliability function to realize reliability evaluation of the product under the multi-stress coupling effect. According to the method, the problem that the multi-stress coupling effect and the influence of the multi-stress coupling effect on the degradation process cannot be accurately and quantitatively described in the product reliability evaluation process is solved.

Description

technical field [0001] The invention belongs to the technical field of product performance degradation and reliability analysis, and relates to a product reliability evaluation method, in particular to a reliability evaluation method considering the influence of multi-stress coupling on product degradation. Background technique [0002] Reliability evaluation of a product refers to analyzing the probability that it can complete the specified function within the specified time through tests and other means. Under the premise of ensuring that the product failure mechanism remains unchanged, the accelerated degradation test can obtain rich product performance parameter degradation data by increasing the test stress and shortening the test period. Accurate accelerated degradation modeling through these degradation data is the core of product reliability assessment. In engineering practice, most products serve under the combined action of multiple stresses, such as temperature, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/20G06F17/10G06F17/15G06F119/02G06F119/04G06F119/14
CPCG06F30/20G06F17/10G06F17/15G06F2119/02G06F2119/04G06F2119/14
Inventor 叶雪荣胡义凡赵子川陈昊郑博恺于松民翟国富
Owner HARBIN INST OF TECH
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