Method for analyzing trace elements by combining surface enhancement and discharge-assisted LIBS (laser-induced breakdown spectroscopy)
A surface enhancement, trace element technology, applied in thermal excitation analysis, material excitation analysis, etc., can solve the problems of large background radiation, only one sample can be obtained, the stability of discharge, the influence of surface roughness of samples, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0031] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0032] The specific implementation of the present invention will be described in detail below with reference to specific embodiments.
[0033] An embodiment of the present invention provides a method for analyzing trace elements in combination with surface enhancement and discharge-assisted LIBS, comprising the following steps:
[0034] Step S1: use an electronic balance to weigh a certain amount of CrCl 3 ·6H 2 O, CuSO 4 ·5H 2 O and Pb (NO 3 ) 2 powder, and then use deionized water to make 10 μg / mL stock solution and dilute it to obtain standard solutions of different concentrations...
PUM
Property | Measurement | Unit |
---|---|---|
length | aaaaa | aaaaa |
diameter | aaaaa | aaaaa |
diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com