Dynamic grating pattern generation method and system for 3D measurement

Abstract

The invention relates to a dynamic grating pattern generation method and system for 3D (three-dimensional) measurement, light emitted by a light-emitting unit array is converged to a grating shaping array by a lens array, after the light passes through the grating shaping array, a light beam in a Y-axis direction is generated through a light beam deflection mechanism for translation, and then the light beam is projected to a working surface through a projection lens. Projected structured light patterns generate element patterns through the grating shaping array, a plurality of light-emitting units which are arranged in parallel at intervals in the light-emitting unit array are used for independently controlling on-off changes and the frequency of stroboflash, and the light beam deflection mechanism rotates to generate grating stripe patterns with the brightness changing in the Y-axis direction under the combined action. Specifically, the light-emitting unit array determines the brightness of a grating strip in a projection pattern through the light source stroboscopic frequency, the precision of the element pattern is controlled through the grating shaping array, and the resolution of the projection pattern is controlled through the light beam deflection mechanism and the stroboscopic of the light-emitting unit, so that a dynamic grating pattern is formed on the working surface.

Description

technical field [0001] The invention relates to the technical fields of optics and electronics, in particular to a method and system for generating a dynamic grating pattern for 3D measurement. Background technique [0002] 3D measurement is being more and more widely used in various fields because it can obtain the depth information of objects. 3D measurement can be divided into line scanning method and surface scanning method according to the technical principle. The surface scanning method is fast and efficient, and has more application prospects. The 3D measurement of the surface scanning method generally needs to project structured light to the object, and use the camera to capture the pattern to calculate the three-dimensional point cloud data. The projected structured light is a specific pattern, such as a speckle pattern. [0003] If the projected structured light is a speckle pattern, only one picture is enough, but the measurement accuracy is not high. For scene...

AI Technical Summary

Problems solved by technology

[0004] 1. The system is complex and costly;

[0005] 2. Low optical utilization;

[0006] 3. In the case of limited volume, the brightness is low. At the same time, because the projector only blocks the light in the low gray area, or reflects it to another, but the light source at the corresponding position is always on, so the dynamic contrast is not high.

[0007] In the prior art, there is no better dynamic pattern generation scheme that can replace multi-purpose projectors that can produce higher contrast, measurement accuracy and resolution

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