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Nail-free clamp for electrical aging test

A technology for testing and electrical aging, applied in the direction of manufacturing tools, workpiece clamping devices, etc., can solve the problems of heavy workload and labor occupation, and achieve the effect of reducing labor force, reducing workload, and improving operating efficiency

Pending Publication Date: 2022-04-12
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a nailless fixture for electrical aging test, which aims to solve the technical problems of heavy workload and large labor force in the method of fastening the product to be tested in the prior art aging test

Method used

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  • Nail-free clamp for electrical aging test
  • Nail-free clamp for electrical aging test
  • Nail-free clamp for electrical aging test

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Embodiment Construction

[0023] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] Please also refer to Figure 1 to Figure 6 , the nailless jig for electrical aging test provided by the present invention will now be described. A nailless fixture for electrical aging tests, including a fixing part 1, a pressing block assembly 2 and two sets of buckles 3, the fixing part 1 is used for detachable connection on the aging board of the aging test, and the middle part of the fixing part 1 is formed with a The placement space of the product 8 to be tested, the product 8 to be tested is placed on the top of the burn-in board in the placement spac...

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Abstract

The invention provides a nail-free clamp for an electrical aging test, and belongs to the technical field of aging tests of discrete semiconductor devices, the nail-free clamp comprises a fixing part, a pressing block assembly and two groups of buckles, the pressing block assembly is clamped and fixed at the upper end of the fixing part by using the two groups of buckles, and meanwhile, a to-be-tested product is fixed at the upper end of an aging plate. The connection mode of the two groups of buckles, the fixing part and the pressing block assembly is simple, the to-be-tested product is fixed without using screws and pressing strips, and the fixing operation efficiency of the product is high. The nail-free clamp for the electrical aging test solves the technical problems that in the aging test in the prior art, the mode of fastening a product to be tested is large in workload and large in occupied labor force, and has the technical effects that the universality is high, appearance damage is avoided, the workload and labor force are reduced, and the operation efficiency is improved by about 3.5 times.

Description

technical field [0001] The invention belongs to the technical field of semiconductor discrete device aging test, and more specifically relates to a nailless fixture for electrical aging test. Background technique [0002] At present, most of the tooling used for the electrical aging test of semiconductor discrete devices still uses screws to fasten the product to the burn-in board, and then fasten the bead to the burn-in board with screws to fix the product (device) to be tested. The function is to make the pins of the device under test contact with the power terminal, so as to conduct the electrical aging test by turning on the power. The defects of this fastening method for the electrical aging test of the product to be tested are: when there are many devices to be tested, the workload is huge, the labor force is large, the screws are easy to be buckled, and it is difficult to take out when the buckle is buckled. The used bead is easy to wear and tear, and it is easy to b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B25B11/00
Inventor 赵鑫燚
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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